Statistical modeling of the program/erase cycling acceleration of low temperature data retention in floating gate nonvolatile memories
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2005 ◽
Vol 45
(9-11)
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pp. 1331-1336
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2006 ◽
Vol 6
(4)
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pp. 528-533
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2021 ◽
2013 ◽
Vol 551
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pp. 551-555
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2009 ◽
Vol 54
(9(5))
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pp. 409-414
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2016 ◽
Vol 16
(7)
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pp. 7295-7300
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