Controlled silicon thinning for design debug of C4 packaged ICs

1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) ◽

10.1109/relphy.1999.761634 ◽

2003 ◽

Cited By ~ 4

Author(s):

R.R. Goruganthu ◽

M. Bruce ◽

J. Birdsley ◽

V. Bruce ◽

G. Gilfeather ◽

...

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