Bayes reliability demonstration test plan for series-systems with binomial subsystem data

2002 ◽  
Author(s):  
Lin Mei Ten ◽  
Min Xie
Keyword(s):  
Test Plan ◽  
Series Systems

AFTC Test Plan Preparation Guide

1994 ◽  
Author(s):  
D. Krohman ◽  
S. Smith ◽  
K. Stone ◽  
R. Knudston
Keyword(s):  
Test Plan

An Overview of Risk-Based EEE Counterfeit Part Detection Based on SAE AS6171

2018 ◽  
Author(s):  
Michael H. Azarian
Keyword(s):  
Risk Assessment ◽  
Multiple Solutions ◽  
Test Equipment ◽  
Assessment Methodology ◽  
Test Plan ◽  
Specific Test ◽  
Risk Assessment Methodology

Abstract As counterfeiting techniques and processes grow in sophistication, the methods needed to detect these parts must keep pace. This has the unfortunate effect of raising the costs associated with managing this risk. In order to ensure that the resources devoted to counterfeit detection are commensurate with the potential effects and likelihood of counterfeit part usage in a particular application, a risk based methodology has been adopted for testing of electrical, electronic, and electromechanical (EEE) parts by the SAE AS6171 set of standards. This paper provides an overview of the risk assessment methodology employed within AS6171 to determine the testing that should be utilized to manage the risk associated with the use of a part. A scenario is constructed as a case study to illustrate how multiple solutions exist to address the risk for a particular situation, and the choice of any specific test plan can be made on the basis of practical considerations, such as cost, time, or the availability of particular test equipment.

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