A General Imperfect Software Debugging Model Considering the Nonlinear Process of Fault Introduction

2014 ◽  
Author(s):  
Jinyong Wang ◽  
Zhibo Wu ◽  
Yanjun Shu ◽  
Zhan Zhang
Keyword(s):  
Nonlinear Process ◽  
Software Debugging

Analog Circuit Failure Analysis Using Time-Resolved Emission

2005 ◽  
Author(s):  
B.J. Cain ◽  
G.L. Woods ◽  
A. Syed ◽  
R. Herlein ◽  
Toshihiro Nomura
Keyword(s):  
Analog Circuits ◽  
Integrated Circuit ◽  
Analog Circuit ◽  
Photon Emission ◽  
Nonlinear Process ◽  
Time Resolved ◽  
Non Invasive ◽  
Highly Nonlinear ◽  
Excellent Spatial Resolution ◽  
5 Ghz

Abstract Time-Resolved Emission (TRE) is a popular technique for non-invasive acquisition of time-domain waveforms from active nodes through the backside of an integrated circuit. [1] State-of-the art TRE systems offer high bandwidths (> 5 GHz), excellent spatial resolution (0.25um), and complete visibility of all nodes on the chip. TRE waveforms are typically used for detecting incorrect signal levels, race conditions, and/or timing faults with resolution of a few ps. However, extracting the exact voltage behavior from a TRE waveform is usually difficult because dynamic photon emission is a highly nonlinear process. This has limited the perceived utility of TRE in diagnosing analog circuits. In this paper, we demonstrate extraction of voltage waveforms in passing and failing conditions from a small-swing, differential logic circuit. The voltage waveforms obtained were crucial in corroborating a theory for some failures inside an 0.18um ASIC.

Nonlinear process monitoring based on load weighted denoising autoencoder

Measurement ◽  
2021 ◽  
Vol 171 ◽  
pp. 108782
Author(s):  
Jiazhen Zhu ◽  
Hongbo Shi ◽  
Bing Song ◽  
Yang Tao ◽  
Shuai Tan ◽  
...  
Keyword(s):  
Process Monitoring ◽  
Nonlinear Process ◽  
Denoising Autoencoder ◽  
Nonlinear Process Monitoring

A NEW GENERALIZED JAYNES–CUMMINGS MODEL BASED ON TWO-MODE PHOTON NUMBER-DIFFERENCE AND OPERATIONAL PHASE

2003 ◽  
Vol 17 (04) ◽  
pp. 153-158 ◽  
Author(s):  
HONG-YI FAN ◽  
HAI-LIANG LU
Keyword(s):  
Photon Number ◽  
Nonlinear Process ◽  
Model Based ◽  
Operational Phase

A new generalized Jaynes–Cummings model based on two-mode photon number-difference and operational phase is presented. The excitation of the atom is proportional to the net variation of the competion of two modes of photons in some nonlinear process. The corresponding Hamiltonian is diagonalized by virtue of the supersymmetric transform.

An imperfect software debugging model considering log-logistic distribution fault content function

2015 ◽  
Vol 100 ◽  
pp. 167-181 ◽  
Author(s):  
Jinyong Wang ◽  
Zhibo Wu ◽  
Yanjun Shu ◽  
Zhan Zhang
Keyword(s):  
Logistic Distribution ◽  
Software Debugging

A Novel Technique of Error Analysis Based on Test Case Combination

2014 ◽  
Vol 536-537 ◽  
pp. 255-258
Author(s):  
Xi Guo
Keyword(s):  
Error Analysis ◽  
Small Area ◽  
Fault Analysis ◽  
Test Case ◽  
Additional Test ◽  
System Parameters ◽  
Novel Technique ◽  
Software Debugging

Based on the model and feature of combination testing, a novel technique of fault analysis based on combination testing is proposed. The faults of software can be triggered by system parameters and their interaction. The result of combination testing is analyzed, and discovered the possible reasons, and then generates an additional test cased which involved from the test case causing the fault, and analysis and verify the result. This method can locate the faults in a relative small area, and can simplify the process of software debugging and testing.

Sign in / Sign up

Export Citation Format

Share Document