Effect of chemical treatment on the optical properties of a cdte photovoltaic device investigated by spectroscopic ellipsometry

2010 ◽  
Author(s):  
Sandeep Kohli ◽  
Venkatesan Manivannan ◽  
James N. Hilfiker ◽  
Patrick R. McCurdy ◽  
Robert A. Enzenroth ◽  
...  
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Chemical Treatment ◽  
Photovoltaic Device

Effect of Chemical Treatment on the Optical Properties of a Cadmium Telluride Photovoltaic Device Investigated by Spectroscopic Ellipsometry

2009 ◽  
Vol 131 (2) ◽  
Author(s):  
Sandeep Kohli ◽  
Venkatesan Manivannan ◽  
James N. Hilfiker ◽  
Patrick R. McCurdy ◽  
Robert A. Enzenroth ◽  
...  
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Solar Cell ◽  
Spectroscopic Ellipsometry ◽  
Cadmium Chloride ◽  
Cdte Layer ◽  
Photovoltaic Device ◽  
Band Gaps ◽  
Copper Treatment ◽  
Treated Layer

Spectroscopic ellipsometry has been successfully used to characterize the CdS/CdTe heterojunction solar cell deposited on TEC15 glass. The effects of copper treatment on the optical properties of a cadmium chloride treated photovoltaic device were investigated using ellipsometry. No changes in either the band gaps or critical points of CdTe layer were noticed as a result of copper treatment. The copper treated CdTe layer exhibited a higher refractive index in the visible and longer wavelengths (≤3 eV), as compared with the untreated layer. This was attributed to the increased disorder in the case of copper treated layer.

scholarly journals Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Spectroscopic Ellipsometry ◽  
Plasmon Resonance ◽  
Complex Refractive Index ◽  
Resonance Spectroscopy ◽  
Doped Polymers

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.

scholarly journals Tailoring the CdS/CdSe/CdTe multilayer structure for optimization of photovoltaic device performance guided by mapping spectroscopic ellipsometry

2021 ◽  
Vol 221 ◽  
pp. 110907
Author(s):  
Mohammed A. Razooqi Alaani ◽  
Prakash Koirala ◽  
Puja Pradhan ◽  
Adam B. Phillips ◽  
Nikolas J. Podraza ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Multilayer Structure ◽  
Photovoltaic Device ◽  
Device Performance

Optical properties of Sub-30 nm-thick ZnS films studied by spectroscopic ellipsometry

2022 ◽  
Vol 142 ◽  
pp. 106454
Author(s):  
Cheng Wang ◽  
Chong Ma ◽  
Junbo He ◽  
Weiming Liu ◽  
Xudan Zhu ◽  
...  
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Zns Films

Optical properties of amorphous hydrogenated carbon films: A spectroscopic ellipsometry study

1987 ◽  
Vol 2 (5) ◽  
pp. 645-647 ◽  
Author(s):  
Shuhan Lin ◽  
Shuguang Chen
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Carbon Films ◽  
Index Of Refraction ◽  
The Real ◽  
Complex Index ◽  
Tentative Explanation ◽  
Amorphous Hydrogenated Carbon ◽  
Ellipsometry Data ◽  
Complex Index Of Refraction

Optical properties of plasma-deposited amorphous hydrogenated carbon films were studied by spectroscopic ellipsometry. From the ellipsometry data, the real and imaginary parts, n and k, of the complex index of refraction of the film have been deduced for photon energies between 2.0 and 4.0 eV for as-grown as well as for thermally annealed films. Here n and k showed considerable variation with subsequent annealing, even under 400°C. A tentative explanation of the results is proposed.

scholarly journals Effect Of Cobalt’s Chloride On The Optical Properties Of Poly (O-Toluidine) And Study Of It’s Organic/Inorganic Solar Cell

2016 ◽  
Vol 12 (3) ◽  
pp. 224
Author(s):  
R. K. Alfahed ◽  
K. I. Ajeel ◽  
A. K. Hassan
Keyword(s):  
Optical Properties ◽  
Solar Cell ◽  
Spin Coating ◽  
Cobalt Chloride ◽  
Photovoltaic Device ◽  
Spin Coating Method ◽  
Type Silicon ◽  
Energy Gaps ◽  
Coating Method ◽  
Ft Ir

Preparation of poly (o-toluidine) was doped by different volume ratios of cobalt chloride and characterized by (FT-IR, XRD and SEM). The results showed that the intensity of absorption increased while energy gaps of the prepared polymer decreased with respect to increasing ratio of the dopant where the direct and indirect energy gaps were calculated, in addition to edge of the absorption. Photovoltaic device was fabricated by deposit the prepared polymer on the n-type silicon by spin coating method, so the batter efficiency of the prepared devices was 3.02% which was tested under dark and illumination with intensity of 100mW/cm².

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