Multimode operation in Gunn oscillators induced by cooling and illumination

K.G. Sewell; L.A. Boatner

doi:10.1109/proc.1967.5807

Multimode operation in Gunn oscillators induced by cooling and illumination

Proceedings of the IEEE ◽

10.1109/proc.1967.5807 ◽

1967 ◽

Vol 55 (7) ◽

pp. 1228-1229 ◽

Cited By ~ 4

Author(s):

K.G. Sewell ◽

L.A. Boatner

Keyword(s):

Gunn Oscillators ◽

Multimode Operation

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InP Gunn Diodes with Current Limiting Contact for High Efficiency Gunn Oscillators

IEICE Transactions on Electronics ◽

10.1587/transele.e93.c.585 ◽

2010 ◽

Vol E93-C (5) ◽

pp. 585-589

Author(s):

Mi-Ra KIM ◽

Jin-Koo RHEE ◽

Chang-Woo LEE ◽

Yeon-Sik CHAE ◽

Jae-Hyun CHOI ◽

...

Keyword(s):

High Efficiency ◽

Gunn Diodes ◽

Current Limiting ◽

Gunn Oscillators

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Thermal effects in the bias circuit frequency modulation of Gunn oscillators

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1971.17241 ◽

1971 ◽

Vol 18 (8) ◽

pp. 557-562 ◽

Cited By ~ 7

Author(s):

B.A.E. DeSa ◽

G.S. Hobson

Keyword(s):

Frequency Modulation ◽

Thermal Effects ◽

Gunn Oscillators

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Investigation of Side Wall Roughness Effect on Optical Losses in a Multimode Si3N4 Waveguide Formed on a Quartz Substrate

Photonics ◽

10.3390/photonics7040104 ◽

2020 ◽

Vol 7 (4) ◽

pp. 104

Author(s):

Anastasia Yakuhina ◽

Alexey Kadochkin ◽

Vyacheslav Svetukhin ◽

Dmitry Gorelov ◽

Sergey Generalov ◽

...

Keyword(s):

Optical Waveguides ◽

Quartz Substrate ◽

Side Wall ◽

Wall Roughness ◽

Roughness Parameters ◽

Optical Losses ◽

Waveguide Width ◽

Integration Density ◽

Frequency Domain Reflectometry ◽

Multimode Operation

This article presents the results of the study of the influence of the most significant parameters of the side wall roughness of an ultra-thin silicon nitride lightguide layer of multimode integrated optical waveguides with widths of 3 and 8 microns. The choice of the waveguide width was made due to the need to provide multimode operation for telecommunication wavelengths, which is necessary to ensure high integration density. Scattering in waveguide structures was measured by optical frequency domain reflectometry (OFDR) of a backscattering reflectometer. The finite difference time domain method (FDTD) was used to study the effect of roughness parameters on optical losses in fabricated waveguides, the roughness parameters that most strongly affect optical scattering were determined, and methods of its significant reduction were specified. The prospects for implementing such structures on a quartz substrate are justified.

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