Switching microwave radiometer using a series-resonant degenrate parametric amplifier in a phase-coherent mode of operation

1963 ◽  
Vol 51 (3) ◽  
pp. 482-483
Author(s):  
C.T. Stelzried
Keyword(s):  
Microwave Radiometer ◽  
Parametric Amplifier ◽  
Coherent Mode ◽  
Series Resonant ◽  
Mode Of Operation

Enhancement of Contrast in the CEM and STEM Using Bumpy Specimens and Employing the “Dappled Field” Mode of Operation

1974 ◽  
Vol 32 ◽  
pp. 552-553 ◽  
Author(s):  
L. Gandolfi ◽  
J. Reiffel
Keyword(s):  
Operating Mode ◽  
Scanning Transmission Electron Microscope ◽  
Dark Field ◽  
Specimen Preparation ◽  
Field Mode ◽  
Preparation Methods ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Mode Of Operation ◽  
Scanning Transmission

Calculations have been performed on the contrast obtainable, using the Scanning Transmission Electron Microscope, in the observation of thick specimens. Recent research indicates a revival of an earlier interest in the observation of thin specimens with the view of comparing the attainable contrast using both types of specimens.Potential for biological applications of scanning transmission electron microscopy has led to a proliferation of the literature concerning specimen preparation methods and the controversy over “to stain or not to stain” in combination with the use of the dark field operating mode and the same choice of technique using bright field mode of operation has not yet been resolved.

High-Voltage Scanning Electron Microscopy

1970 ◽  
Vol 28 ◽  
pp. 6-7
Author(s):  
J. M. Cowley
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Wave Optics ◽  
Contrast Effects ◽  
Transmission Electron ◽  
Mode Of Operation ◽  
Scanning Transmission ◽  
Types Of Information ◽  
Voltage Scanning

The comparison of scanning transmission electron microscopy (STEM) with conventional transmission electron microscopy (CTEM) can best be made by means of the Reciprocity Theorem of wave optics. In Fig. 1 the intensity measured at a point A’ in the CTEM image due to emission from a point B’ in the electron source is equated to the intensity at a point of the detector, B, due to emission from a point A In the source In the STEM. On this basis it can be demonstrated that contrast effects In the two types of instrument will be similar. The reciprocity relationship can be carried further to include the Instrument design and experimental procedures required to obtain particular types of information. For any. mode of operation providing particular information with one type of microscope, the analagous type of operation giving the same information can be postulated for the other type of microscope. Then the choice between the two types of instrument depends on the practical convenience for obtaining the required Information.

Transmission Scanning Electron Microscopy and Energy Analysis with the Siemens ELMISKOP 101

1972 ◽  
Vol 30 ◽  
pp. 450-451
Author(s):  
H. M. Thieringer
Keyword(s):  
Objective Lens ◽  
Transmission Microscopy ◽  
Image Recording ◽  
Mode Of Operation ◽  
Scanning Transmission ◽  
Electron Microscopes ◽  
And Performance ◽  
Convergent Beam ◽  
Ray Path ◽  
Beam Diffraction

It has repeatedly been show that with conventional electron microscopes very fine electron probes can be produced, therefore allowing various micro-techniques such as micro recording, X-ray microanalysis and convergent beam diffraction. In this paper the function and performance of an SIEMENS ELMISKOP 101 used as a scanning transmission microscope (STEM) is described. This mode of operation has some advantages over the conventional transmission microscopy (CTEM) especially for the observation of thick specimen, in spite of somewhat longer image recording times.Fig.1 shows schematically the ray path and the additional electronics of an ELMISKOP 101 working as a STEM. With a point-cathode, and using condensor I and the objective lens as a demagnifying system, an electron probe with a half-width ob about 25 Å and a typical current of 5.10-11 amp at 100 kV can be obtained in the back focal plane of the objective lens.

PARAMETERS OF A JOSEPHSON TUNNEL JUNCTION ARRAY PARAMETRIC AMPLIFIER

1978 ◽  
Vol 39 (C6) ◽  
pp. C6-1234-C6-1235 ◽  
Author(s):  
T. Claeson ◽  
S. Rudner ◽  
S. Wahlsten
Keyword(s):  
Tunnel Junction ◽  
Parametric Amplifier ◽  
Josephson Tunnel ◽  
Junction Array

High-Voltage Generator with Constant Magnets and Toroidal Winding for Intermitted Mode of Operation

2018 ◽  
Vol 11 (1) ◽  
pp. 39
Author(s):  
Vyacheslav Vavilov ◽  
Flur Ismagilov ◽  
Irek Khayrullin ◽  
Ruslan Dinarovich Karimov
Keyword(s):  
High Voltage ◽  
Voltage Generator ◽  
Mode Of Operation ◽  
High Voltage Generator

Image Simulator for One Dimensional Synthetic Aperture Microwave Radiometer

PIERS Online ◽  
2005 ◽  
Vol 1 (5) ◽  
pp. 524-528 ◽  
Author(s):  
Qiong WU ◽  
Hao Liu ◽  
Ji Wu
Keyword(s):  
Microwave Radiometer ◽  
Synthetic Aperture ◽  
One Dimensional
Sign in / Sign up

Export Citation Format

Share Document