Experimental study of Single Event Upsets on deep submicron and nano devices in space

2017 ◽  
Author(s):  
Qingkui Yu ◽  
Yi Sun ◽  
Lei Luo ◽  
Bo Mei ◽  
Zhichao Wei ◽  
...  
Keyword(s):  
Experimental Study ◽  
Deep Submicron ◽  
Single Event ◽  
Single Event Upsets

Impact of Single-Event Upsets in Deep-Submicron Silicon Technology

MRS Bulletin ◽  
2003 ◽  
Vol 28 (2) ◽  
pp. 117-120 ◽  
Author(s):  
Robert Baumann
Keyword(s):  
Soft Errors ◽  
Deep Submicron ◽  
Soft Error ◽  
Mitigation Strategies ◽  
Single Event ◽  
Radiation Mechanisms ◽  
Silicon Technology ◽  
Single Event Upsets ◽  
Radiation Induced ◽  
Considerable Concern

AbstractThe once-ephemeral soft error phenomenon has recently caused considerable concern for manufacturers of advanced silicon technology. Soft errors, if unchecked, now have the potential for inducing a higher failure rate than all of the other reliability-failure mechanisms combined. This article briefly reviews the three dominant radiation mechanisms responsible for soft errors in terrestrial applications and how soft errors are generated by the collection of radiation-induced charge. Scaling trends in the soft error sensitivity of various memory and logic components are presented, along with a consideration of which applications are most likely to require intervention. Some of the mitigation strategies that can be employed to reduce the soft error rate in these devices are also discussed.

Muon-Induced Single Event Upsets in Deep-Submicron Technology

2010 ◽  
Author(s):  
Brian D. Sierawski ◽  
Marcus H. Mendenhall ◽  
Robert A. Reed ◽  
Michael A. Clemens ◽  
Robert A. Weller ◽  
...  
Keyword(s):  
Deep Submicron ◽  
Single Event ◽  
Single Event Upsets

Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMs

2005 ◽  
Vol 52 (6) ◽  
pp. 2319-2325 ◽  
Author(s):  
J. Baggio ◽  
V. Ferlet-Cavrois ◽  
D. Lambert ◽  
P. Paillet ◽  
F. Wrobel ◽  
...  
Keyword(s):  
Single Event ◽  
Fully Depleted ◽  
Single Event Upsets

Single event upsets in gallium arsenide dynamic logic

1994 ◽  
Vol 41 (6) ◽  
pp. 2244-2251 ◽  
Author(s):  
D.J. Fouts ◽  
T. Weatherford ◽  
D. McMorrow ◽  
J.S. Melinger ◽  
A.B. Campbell
Keyword(s):  
Gallium Arsenide ◽  
Dynamic Logic ◽  
Single Event ◽  
Single Event Upsets

(Invited) Total Dose Effects and Single Event Upsets During Radiation Damage of GaN and SiC

2021 ◽  
Vol 104 (7) ◽  
pp. 13-34
Author(s):  
Ani Khachatrian ◽  
Adrian Ildefonso ◽  
Zahabul Islam ◽  
Md Abu Jafar Rasel ◽  
Amanul Haque ◽  
...  
Keyword(s):  
Total Dose ◽  
Radiation Damage ◽  
Single Event ◽  
Single Event Upsets ◽  
Dose Effects ◽  
Total Dose Effects

Role of Elastic Scattering of Protons, Muons, and Electrons in Inducing Single-Event Upsets

2017 ◽  
Vol 64 (10) ◽  
pp. 2648-2660 ◽  
Author(s):  
Avraham Akkerman ◽  
Joseph Barak ◽  
Nir M. Yitzhak
Keyword(s):  
Elastic Scattering ◽  
Single Event ◽  
Single Event Upsets
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