Admittance and photoadmittance spectroscopy of zinc oxide layers grown on p-Si substrates by sol-gel and spin coating method

Author(s):  
P. Popielarski ◽  
W. Bala ◽  
K. Paprocki
2013 ◽  
Vol 8 (1) ◽  
pp. 306 ◽  
Author(s):  
Kuo-Min Huang ◽  
Chong-Lung Ho ◽  
Heng-Jui Chang ◽  
Meng-Chyi Wu

2013 ◽  
Vol 284-287 ◽  
pp. 347-351 ◽  
Author(s):  
Kai Loong Foo ◽  
Muhammad Kashif ◽  
Uda Hashim

This In this work, zinc oxide film was deposited onto the SiO2/Si substrate with low-cost sol-gel spin coating method. Zinc oxide thin film was deposited on the silver interdigit elctrodes for the pH measurement. The surface morphology and microstructures of the deposited zinc oxide films were analyzed by field emission scanning electron microscope (FESEM) and atomic force microscope (AFM). Whereas the crystallinity and structure of the zinc oxide films were determined by X-ray diffraction (XRD) and Fourier transform infrared spectroscopy (FTIR). The measurement at various pH values, which were ±1 above and below of the neutral pH had been conducted with a real time dielectric analyzer measurement. It was observed that the increase in pH would decrease the capacitance of the device.


2017 ◽  
Vol 623 ◽  
pp. 14-18 ◽  
Author(s):  
Fenglin Tang ◽  
Chao Mei ◽  
Peiyu Chuang ◽  
Tingting Song ◽  
Hailin Su ◽  
...  

Author(s):  
Ibrahim Mohd Yazid ◽  
Muhammad Hazim Raselan ◽  
Shafinaz Sobihana Shariffudin ◽  
Puteri Sarah Mohamad Saad ◽  
Sukreen Hana ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document