Progress of InP monolithically integrated photonic circuits for switching and digital processing

2012 ◽  
Author(s):  
Yoshiaki Nakano ◽  
Takuo Tanemura
Keyword(s):  
Digital Processing ◽  
Photonic Circuits ◽  
Monolithically Integrated

MOMBE: superior epitaxial growth for InP-based monolithically integrated photonic circuits

2000 ◽  
Vol 209 (2-3) ◽  
pp. 463-470 ◽  
Author(s):  
R Gibis ◽  
H Kizuki ◽  
P Albrecht ◽  
P Harde ◽  
G Urmann ◽  
...  
Keyword(s):  
Epitaxial Growth ◽  
Photonic Circuits ◽  
Monolithically Integrated

scholarly journals Monolithically Integrated Multilayer Silicon Nitride-on-Silicon Waveguide Platforms for 3-D Photonic Circuits and Devices

2018 ◽  
Vol 106 (12) ◽  
pp. 2232-2245 ◽  
Author(s):  
Wesley D. Sacher ◽  
Jared C. Mikkelsen ◽  
Ying Huang ◽  
Jason C. C. Mak ◽  
Zheng Yong ◽  
...  
Keyword(s):  
Silicon Nitride ◽  
Photonic Circuits ◽  
Monolithically Integrated ◽  
Silicon Waveguide

Architecting a nonlinear hybrid crystal–glass metamaterial fiber for all-optical photonic integration

2018 ◽  
Vol 6 (7) ◽  
pp. 1659-1669 ◽  
Author(s):  
Chien-Chih Lai ◽  
Chia-Yao Lo ◽  
Jian-Zhi Huang ◽  
Chien-Chou Fan Chiang ◽  
Duc Huy Nguyen ◽  
...  
Keyword(s):  
Crystal Glass ◽  
Photonic Integration ◽  
Fiber Architecture ◽  
Photonic Circuits ◽  
Monolithically Integrated ◽  
All Optical ◽  
Nonlinear Hybrid

A hybrid crystal–glass metamaterial fiber architecture foregrounds the prospect of intracavity and resonant SHG conversions for monolithically integrated photonic circuits.

A method to measure pores and fissures in geologic materials under S.E.M. by digital image processing

1978 ◽  
Vol 36 (1) ◽  
pp. 212-213
Author(s):  
L. Montoto ◽  
M. Montoto ◽  
A. Bel-Lan
Keyword(s):  
Image Processing ◽  
Optical Microscopy ◽  
Digital Image Processing ◽  
Digital Image ◽  
Digital Processing ◽  
Free Surfaces ◽  
Geologic Materials ◽  
Automatic Information ◽  
Detector Output ◽  
Rock Specimens

INTRODUCTION.- The physical properties of rock masses are greatly influenced by their internal discontinuities, like pores and fissures. So, these need to be measured as a basis for interpretation. To avoid the basic difficulties of measurement under optical microscopy and analogic image systems, the authors use S.E.M. and multiband digital image processing. In S.E.M., analog signal processing has been used to further image enhancement (1), but automatic information extraction can be achieved by simple digital processing of S.E.M. images (2). The use of multiband image would overcome difficulties such as artifacts introduced by the relative positions of sample and detector or the typicals encountered in optical microscopy.DIGITAL IMAGE PROCESSING.- The studied rock specimens were in the form of flat deformation-free surfaces observed under a Phillips SEM model 500. The SEM detector output signal was recorded in picture form in b&w negatives and digitized using a Perkin Elmer 1010 MP flat microdensitometer.

Digital Processing of STEM Images

1981 ◽  
Vol 39 ◽  
pp. 236-237
Author(s):  
A. V. Crewe ◽  
M. Ohtsuki
Keyword(s):  
High Resolution ◽  
Low Dose ◽  
Assembly Language ◽  
Processing System ◽  
Principal Component ◽  
Digital Processing ◽  
Image Analysis System ◽  
Black And White ◽  
Analysis System ◽  
Dose Imaging

We have assembled an image processing system for use with our high resolution STEM for the particular purpose of working with low dose images of biological specimens. The system is quite flexible, however, and can be used for a wide variety of images.The original images are stored on magnetic tape at the microscope using the digitized signals from the detectors. For low dose imaging, these are “first scan” exposures using an automatic montage system. One Nova minicomputer and one tape drive are dedicated to this task.The principal component of the image analysis system is a Lexidata 3400 frame store memory. This memory is arranged in a 640 x 512 x 16 bit configuration. Images are displayed simultaneously on two high resolution monitors, one color and one black and white. Interaction with the memory is obtained using a Nova 4 (32K) computer and a trackball and switch unit provided by Lexidata.The language used is BASIC and uses a variety of assembly language Calls, some provided by Lexidata, but the majority written by students (D. Kopf and N. Townes).

Routine Digital Processing of Microscope Images

1990 ◽  
Vol 48 (1) ◽  
pp. 550-551
Author(s):  
E. Wisse ◽  
A. Geerts ◽  
R.B. De Zanger
Keyword(s):  
Operating System ◽  
Digital Processing ◽  
Hard Disks ◽  
The Sun ◽  
Tape Drive ◽  
High Definition ◽  
Fluorescent Microscope ◽  
Microscope Images ◽  
Helical Scan ◽  
Ethernet Connection

The slowscan and TV signal of the Philips SEM 505 and the signal of a TV camera attached to a Leitz fluorescent microscope, were digitized by the data acquisition processor of a Masscomp 5520S computer, which is based on a 16.7 MHz 68020 CPU with 10 Mb RAM memory, a graphics processor with two frame buffers for images with 8 bit / 256 grey values, a high definition (HD) monitor (910 × 1150), two hard disks (70 and 663 Mb) and a 60 Mb tape drive. The system is equipped with Imaging Technology video digitizing boards: analog I/O, an ALU, and two memory mapped frame buffers for TV images of the IP 512 series. The Masscomp computer has an ethernet connection to other computers, such as a Vax PDP 11/785, and a Sun 368i with a 327 Mb hard disk and a SCSI interface to an Exabyte 2.3 Gb helical scan tape drive. The operating system for these computers is based on different versions of Unix, such as RTU 4.1 (including NFS) on the acquisition computer, bsd 4.3 for the Vax, and Sun OS 4.0.1 for the Sun (with NFS).

Recent Progress and Plans in Computer-Controlled High Resolution Electron Microscopy

1990 ◽  
Vol 48 (1) ◽  
pp. 154-155
Author(s):  
W.J. de Ruijter ◽  
Peter Rez ◽  
David J. Smith
Keyword(s):  
Electron Microscopy ◽  
Digital Processing ◽  
High Resolution Electron Microscopy ◽  
Objective Lens ◽  
Linear Filter ◽  
Contrast Transfer Function ◽  
Image Displacement ◽  
Spatially Resolved ◽  
Wide Range ◽  
On Line

Digital computers are becoming widely recognized as standard accessories for electron microscopy. Due to instrumental innovations the emphasis in digital processing is shifting from off-line manipulation of electron micrographs to on-line image acquisition, analysis and microscope control. An on-line computer leads to better utilization of the instrument and, moreover, the flexibility of software control creates the possibility of a wide range of novel experiments, for example, based on temporal and spatially resolved acquisition of images or microdiffraction patterns. The instrumental resolution in electron microscopy is often restricted by a combination of specimen movement, radiation damage and improper microscope adjustment (where the settings of focus, objective lens stigmatism and especially beam alignment are most critical). We are investigating the possibility of proper microscope alignment based on computer induced tilt of the electron beam. Image details corresponding to specimen spacings larger than ∼20Å are produced mainly through amplitude contrast; an analysis based on geometric optics indicates that beam tilt causes a simple image displacement. Higher resolution detail is characterized by wave propagation through the optical system of the microscope and we find that beam tilt results in a dispersive image displacement, i.e. the displacement varies with spacing. This approach is valid for weak phase objects (such as amorphous thin films), where transfer is simply described by a linear filter (phase contrast transfer function) and for crystalline materials, where imaging is described in terms of dynamical scattering and non-linear imaging theory. In both cases beam tilt introduces image artefacts.

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