FSM-Based Programmable Memory BIST with Macro Command

2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) ◽

10.1109/mtdt.2005.24 ◽

2005 ◽

Cited By ~ 5

Author(s):

Po-Chang Tsai ◽

Sying-Jyan Wang ◽

Feng-Ming Chang

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