Dielectric Tunnel Parameters of CoFe/Al-O/CoFe in MTJ for 1T1MTJ MRAM Applications

2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) ◽

10.1109/mtdt.2005.20 ◽

2005 ◽

Author(s):

S.C. Li ◽

J.M. Lee ◽

M.F. Shu ◽

J.P. Su ◽

T.-H. Wu

Download Full-text