DFT Techniques for Memory Macro with Built-In ECC

2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) ◽

10.1109/mtdt.2005.19 ◽

2005 ◽

Cited By ~ 3

Author(s):

K. Kushida ◽

N. Otsuka ◽

O. Hirabayashi ◽

Y. Takeyama

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