scholarly journals The Performance Vulnerability of Architectural and Non-architectural Arrays to Permanent Faults

2012 ◽  
Author(s):  
Damien Hardy ◽  
Isidoros Sideris ◽  
Nikolas Ladas ◽  
Yiannakis Sazeides
Keyword(s):  
Permanent Faults

An efficient fault-tolerant routing algorithm in NoCs to tolerate permanent faults

2016 ◽  
Vol 72 (12) ◽  
pp. 4629-4650 ◽  
Author(s):  
Reza Akbar ◽  
Ali Asghar Etedalpour ◽  
Farshad Safaei
Keyword(s):  
Fault Tolerant ◽  
Routing Algorithm ◽  
Permanent Faults

scholarly journals ARQUITETURA PARA IDENTIFICAR E ESTIMAR REGIÕES DE FALTAS PERMANENTES EM MÉDIA TENSÃO: UMA CONTRIBUIÇÃO DA PLATAFORMA SMATLVGRID / ARCHITECTURE TO IDENTIFY AND ESTIMATE REGIONS OF PERMANENT FAULTS IN MEDIUM VOLTAGE: A CONTRIBUTION OF THE SMATLVGRID PLATFORM

2021 ◽  
Vol 7 (3) ◽  
pp. 24845-24860
Author(s):  
Daniel Sousa da Silva ◽  
Lennon Brandão Freitas do Nascimento ◽  
Rubens de Andrade Fernandes ◽  
Raimundo Cláudio Souza Gomes ◽  
Israel Gondres Torné
Keyword(s):  
Medium Voltage ◽  
Permanent Faults

Built-In Self Repair for Logic Structures

2014 ◽  
pp. 1376-1402
Author(s):  
Tobias Koal ◽  
Heinrich T. Vierhaus
Keyword(s):  
Software Systems ◽  
Gate Arrays ◽  
Regular Structures ◽  
Permanent Faults ◽  
Integrated Devices ◽  
Field Programmable ◽  
Programmable Gate Arrays ◽  
Self Repair ◽  
Logic Structures ◽  
Time Of Operation

For several years, many authors have predicted that nano-scale integrated devices and circuits will have a rising sensitivity to both transient and permanent faults effects. Essentially, there seems to be an emerging demand for building highly dependable hardware / software systems from unreliable components. Most of the effort has so far gone into the detection and compensation of transient fault effects. More recently, also the possibility of repairing permanent faults, due to either production flaws or to wear-out effects after some time of operation in the field of application, needs further investigation. While built-in self test (BIST) and even self repair (BISR) for regular structures such as static memories (SRAMs) is well understood, concepts for in-system repair of irregular logic and interconnects are few and mainly based on field-programmable gate-arrays (FPGAs) as the basic implementation. In this chapter, the authors try to analyse different schemes of logic (self-) repair with respect to cost and limitations, using repair schemes that are not based on FPGAs. It can be shown that such schemes are feasible, but need lot of attention in terms of hidden single points of failure.

scholarly journals Throughput Maximization for Multicore Energy-Harvesting Systems Suffering Both Transient and Permanent Faults

IEEE Access ◽  
2019 ◽  
Vol 7 ◽  
pp. 98462-98473 ◽  
Author(s):  
Junlong Zhou ◽  
Peijin Cong ◽  
Jin Sun ◽  
Xiumin Zhou ◽  
Tongquan Wei ◽  
...  
Keyword(s):  
Energy Harvesting ◽  
Throughput Maximization ◽  
Permanent Faults ◽  
Harvesting Systems
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