Coexistence of Memristive Behaviors and Negative Capacitance Effects in Single-Crystal $\hbox{TiO}_{2}$ Thin-Film-Based Devices
2012 ◽
Vol 33
(6)
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pp. 890-892
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2008 ◽
Vol 254
(23)
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pp. 7838-7842
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2005 ◽
Vol 44
(10)
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pp. 7605-7607
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1999 ◽
Vol 3
(1)
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pp. 59
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