Extracting Mobility Degradation and Total Series Resistance of Cylindrical Gate-All-Around Silicon Nanowire Field-Effect Transistors
2009 ◽
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pp. 665-667
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2002 ◽
Vol 17
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pp. 938-941
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2010 ◽
Vol 49
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pp. 04DN06
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Vol 9
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pp. 12046-12053
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2016 ◽
Vol 49
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pp. 255104
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