Dynamic Bias Instability of p-Channel Polycrystalline-Silicon Thin-Film Transistors Induced by Impact Ionization

Ching-Fang Huang;  Hung-Chang Sun;  Ying-Jhe Yang;  Yen-Ting Chen;  Chun-Yuan Ku;  Chee Wee Liu;  Yuan-Jun Hsu;  Ching-Chieh Shih;  Jim-Shone Chen

doi:10.1109/led.2009.2013644

Dynamic Bias Instability of p-Channel Polycrystalline-Silicon Thin-Film Transistors Induced by Impact Ionization

IEEE Electron Device Letters ◽

10.1109/led.2009.2013644 ◽

2009 ◽

Vol 30 (4) ◽

pp. 368-370 ◽

Cited By ~ 11

Author(s):

Ching-Fang Huang ◽

Hung-Chang Sun ◽

Ying-Jhe Yang ◽

Yen-Ting Chen ◽

Chun-Yuan Ku ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Impact Ionization ◽

Silicon Thin Film ◽

Bias Instability ◽

Dynamic Bias

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Effect of interface roughness on gate bias instability of polycrystalline silicon thin-film transistors

Journal of Applied Physics ◽

10.1063/1.1508421 ◽

2002 ◽

Vol 92 (8) ◽

pp. 4741-4745 ◽

Cited By ~ 10

Author(s):

N. A. Hastas ◽

C. A. Dimitriadis ◽

G. Kamarinos

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Interface Roughness ◽

Gate Bias ◽

Silicon Thin Film ◽

Bias Instability

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Determination of excess current due to impact ionization in polycrystalline silicon thin-film transistors

Solid-State Electronics ◽

10.1016/s0038-1101(97)00262-1 ◽

1998 ◽

Vol 42 (4) ◽

pp. 613-618 ◽

Cited By ~ 6

Author(s):

I. Policicchio ◽

A. Pecora ◽

R. Carluccio ◽

L. Mariucci ◽

G. Fortunato ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Impact Ionization ◽

Silicon Thin Film ◽

Excess Current

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Gate Bias Instability under Light Irradiation in Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.03ca06 ◽

2010 ◽

Vol 49 (3) ◽

pp. 03CA06 ◽

Cited By ~ 6

Author(s):

Hidehito Kitakado ◽

Takuto Yasumatsu

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Light Irradiation ◽

Gate Bias ◽

Silicon Thin Film ◽

Bias Instability

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Gate bias instability in polycrystalline silicon thin film transistors formed using various gate dielectrics

Microelectronic Engineering ◽

10.1016/0167-9317(92)90402-d ◽

1992 ◽

Vol 19 (1-4) ◽

pp. 105-108 ◽

Cited By ~ 9

Author(s):

ND Young ◽

A Gill

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Gate Dielectrics ◽

Gate Bias ◽

Silicon Thin Film ◽

Bias Instability

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Gate bias instability in hydrogenated polycrystalline silicon thin-film transistors

Journal of Applied Physics ◽

10.1063/1.1289525 ◽

2000 ◽

Vol 88 (6) ◽

pp. 3624-3628 ◽

Cited By ~ 11

Author(s):

C. A. Dimitriadis

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Gate Bias ◽

Silicon Thin Film ◽

Bias Instability

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Role of field enhanced mechanisms and impact ionization on the threshold voltage of short channel polycrystalline silicon thin film transistors

Applied Physics Letters ◽

10.1063/1.3027478 ◽

2008 ◽

Vol 93 (19) ◽

pp. 193512 ◽

Cited By ~ 5

Author(s):

P. Gaucci ◽

A. Valletta ◽

L. Mariucci ◽

A. Pecora ◽

M. Cuscunà ◽

...

Keyword(s):

Thin Film ◽

Threshold Voltage ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Impact Ionization ◽

Silicon Thin Film ◽

Short Channel

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Effect of Dynamic Bias Stress in Short-Channel ($L=1.5$ $\mu$m) p-Type Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.51.021401 ◽

2012 ◽

Vol 51 ◽

pp. 021401

Author(s):

Sung-Hwan Choi ◽

Yeon-Gon Mo ◽

Hye-Dong Kim ◽

Min-Koo Han

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Short Channel ◽

Bias Stress ◽

P Type ◽

Dynamic Bias

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Comprehensive study on dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistors

2007 International Semiconductor Device Research Symposium ◽

10.1109/isdrs.2007.4422557 ◽

2007 ◽

Author(s):

C.-F. Huang ◽

Y.-J. Yang ◽

C.-Y. Peng ◽

H.-C. Sun ◽

C. W. Liu ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Dynamic Bias ◽

Comprehensive Study

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Effect of Dynamic Bias Stress in Short-Channel (L=1.5 µm) p-Type Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.7567/jjap.51.021401 ◽

2012 ◽

Vol 51 (2R) ◽

pp. 021401

Author(s):

Sung-Hwan Choi ◽

Yeon-Gon Mo ◽

Hye-Dong Kim ◽

Min-Koo Han

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Short Channel ◽

Bias Stress ◽

P Type ◽

Dynamic Bias

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Dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistors

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2009.5232678 ◽

2009 ◽

Cited By ~ 5

Author(s):

Ching-Fang Huang ◽

Hung-Chang Sun ◽

Ping-Sheng Kuo ◽

Yen-Ting Chen ◽

Chee Wee Liu ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Dynamic Bias

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