Device performance of transistors with high-/spl kappa/ dielectrics using cross-wafer-scaled interface-layer thickness
2006 ◽
Vol 27
(7)
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pp. 546-548
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2020 ◽
Vol 495
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pp. 165858
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Keyword(s):
2001 ◽
Vol 34
(14)
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pp. 2085-2088
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1994 ◽
Vol 29
(7)
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pp. 1773-1780
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2003 ◽
Vol 444
(1-2)
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pp. 158-164
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