scholarly journals Forensic Analysis of File System Intrusions Using Improved Backtracking

Author(s):  
S. Sitaraman ◽  
S. Venkatesan
2017 ◽  
Vol 22 ◽  
pp. S76-S85 ◽  
Author(s):  
Jan-Niclas Hilgert ◽  
Martin Lambertz ◽  
Daniel Plohmann

2018 ◽  
Vol 27 ◽  
pp. 57-70 ◽  
Author(s):  
Wasim Ahmad Bhat ◽  
Mohamad Ahtisham Wani

Data in Brief ◽  
2018 ◽  
Vol 18 ◽  
pp. 2013-2018 ◽  
Author(s):  
Mohamad Ahtisham Wani ◽  
Wasim Ahmad Bhat

2015 ◽  
Vol 57 (6) ◽  
Author(s):  
Felix C. Freiling ◽  
Jan C. Schuhr ◽  
Michael Gruhn

AbstractIn his seminal work on file system forensic analysis, Brian Carrier defined the notion of


Electronics ◽  
2019 ◽  
Vol 8 (11) ◽  
pp. 1322
Author(s):  
Ashar Neyaz ◽  
Narasimha Shashidhar

A USB mass storage device yields a lot of artifacts when connected to a system. These artifacts are persistent in nature and are retained even after the system has been shut down and the information they contain may assist in carrying out forensic analysis on a suspect system. In this paper, we demonstrate how Windows Event Viewer can be used to find forensic artifacts in a suspect system for investigative purposes. We also discuss the potential that Windows registry holds to identify USB devices’ information that have been connected to the system, to corroborate our findings from Windows Event Viewer. Finally, we use the Windows 10 file system to extract log details that contain the setup information of a USB device that was connected to the system the very first time, and obtain the necessary identifiers and time stamp details.


2020 ◽  
Vol 32 ◽  
pp. 300915
Author(s):  
Paul Prade ◽  
Tobias Groβ ◽  
Andreas Dewald

Author(s):  
Edward G. Bartick ◽  
John A. Reffner

Since the introduction of commercial Fourier transform infrared (FTIR) microscopic systems in 1983, IR microscopy has developed as an important analytical tool in research, industry and forensic analysis. Because of the frequent encounter of small quantities of physical evidence found at crime scenes, spectroscopic IR microscopes have proven particularly valuable for forensic applications. Transmittance and reflectance measurements have proven very useful. Reflection-absorption, specular reflection, and diffuse reflection have all been applied. However, it has been only very recently that an internal reflection (IRS) objective has been commercially introduced.The IRS method, also known as attenuated total reflection (ATR), has proven very useful for IR analysis of standard size samples. The method has been applied to adhesive tapes, plastic explosives, and general applications in the analysis of opaque materials found as evidence. The small quantities or uncontaminated areas of specimens frequently found requiring forensic analysis will often be directly applicable to microscopic IRS analysis.


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