Local work function of transition metal nitrides and carbides measured by Kelvin probe force microscopy

2004 ◽  
Author(s):  
K. Miya ◽  
M. Sasaki ◽  
S. Yamamoto ◽  
Y. Gotoh ◽  
J. Ishikawa
Keyword(s):  
Transition Metal ◽  
Work Function ◽  
Kelvin Probe Force Microscopy ◽  
Metal Nitrides ◽  
Transition Metal Nitrides ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Local Work

Local work function of a rutile TiO2()-(1×1) surface observed by Kelvin probe force microscopy

2003 ◽  
Vol 529 (1-2) ◽  
pp. L245-L250 ◽  
Author(s):  
Akira Sasahara ◽  
Hiroshi Uetsuka ◽  
Hiroshi Onishi
Keyword(s):  
Work Function ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Local Work

Influence of Molecular Order on the Local Work Function of Nanographene Architectures: A Kelvin-Probe Force Microscopy Study

ChemPhysChem ◽  
2005 ◽  
Vol 6 (11) ◽  
pp. 2371-2375 ◽  
Author(s):  
Vincenzo Palermo ◽  
Matteo Palma ◽  
Željko Tomović ◽  
Mark D. Watson ◽  
Rainer Friedlein ◽  
...  
Keyword(s):  
Work Function ◽  
Microscopy Study ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Molecular Order ◽  
Force Microscopy ◽  
Local Work

scholarly journals Work function difference of naphthyl end-capped oligothiophene in different crystal alignments studied by Kelvin probe force microscopy

2020 ◽  
pp. 106060
Author(s):  
Mads Nibe Larsen ◽  
Mads Svanborg Peters ◽  
Rodrigo Lemos-Silva ◽  
Demetrio A. Da Silva Filho ◽  
Bjarke Jørgensen ◽  
...  
Keyword(s):  
Work Function ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Work Function Difference ◽  
Function Difference

Relation between work function and structural properties of triangular defects in 4H-SiC epitaxial layer: Kelvin probe force microscopic and spectroscopic analyses

Nanoscale ◽  
2020 ◽  
Vol 12 (15) ◽  
pp. 8216-8229
Author(s):  
Hong-Ki Kim ◽  
Soo In Kim ◽  
Seongjun Kim ◽  
Nam-Suk Lee ◽  
Hoon-Kyu Shin ◽  
...  
Keyword(s):  
Work Function ◽  
Structural Properties ◽  
Epitaxial Layer ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Spectroscopic Analyses ◽  
Work Function Difference ◽  
Function Difference

In the defective SiC epitaxial layer, the work function variation was observed by Kelvin probe force microscopy (KPFM), and the work function difference came from the variation of polytype and the disordered surface.

Mechanical Stress Characterization of Shallow Trench Isolation by Kelvin Probe Force Microscopy

1999 ◽  
Vol 568 ◽  
Author(s):  
Hernan Rueda ◽  
James Slinkman ◽  
Dureseti Chidambarrao ◽  
Leon Moszkowicz ◽  
Phil Kaszuba ◽  
...  
Keyword(s):  
Finite Element ◽  
Work Function ◽  
Mechanical Stress ◽  
Mechanical Strain ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Shallow Trench Isolation ◽  
Force Microscopy ◽  
Trench Isolation

ABSTRACTmethod for characterizing the mechanical stress induced in silicon technology is described. Analysis by scanning Kelvin probe force microscopy (SKPM) coupled with finite-element (FE) mechanical strain simulations is performed. The SKPM technique detects variations in the semiconductor work function due to strain influences on the band gap. This technique is then used to analyze the strain induced by shallow trench isolation processes for electrical isolation. The SKPM measurements agree with the FE simulations qualitatively.

Local charge writing in epitaxial SmNiO3 thin films

2014 ◽  
Vol 2 (19) ◽  
pp. 3805-3811 ◽  
Author(s):  
Feng Yan ◽  
Frank Schoofs ◽  
Jian Shi ◽  
Sieu D. Ha ◽  
R. Jaramillo ◽  
...  
Keyword(s):  
Thin Films ◽  
Work Function ◽  
Insulator Transition ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Metal Insulator Transition ◽  
Metal Insulator ◽  
Force Microscopy ◽  
Local Charge

We have investigated the evolution of work function in epitaxial correlated perovskite SmNiO3 (SNO) thin films spanning the metal–insulator transition (MIT) by Kelvin probe force microscopy (KPFM).

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