Multiphysics Modeling and Impact of Thermal Boundary Resistance in Phase Change Memory Devices

2006 ◽  
Author(s):  
J. Reifenberg ◽  
E. Pop ◽  
A. Gibby ◽  
S. Wong ◽  
K. Goodson
Keyword(s):  
Phase Change ◽  
Phase Change Memory ◽  
Boundary Resistance ◽  
Thermal Boundary Resistance ◽  
Memory Devices ◽  
Multiphysics Modeling ◽  
Change Memory

Thermal Boundary Resistance Measurements for Phase-Change Memory Devices

2010 ◽  
Vol 31 (1) ◽  
pp. 56-58 ◽  
Author(s):  
J.P. Reifenberg ◽  
Kuo-Wei Chang ◽  
M.A. Panzer ◽  
Sangbum Kim ◽  
J.A. Rowlette ◽  
...  
Keyword(s):  
Phase Change ◽  
Phase Change Memory ◽  
Boundary Resistance ◽  
Thermal Boundary Resistance ◽  
Memory Devices ◽  
Change Memory

Precision of synaptic weights programmed in phase-change memory devices for deep learning inference

2020 ◽  
Author(s):  
S. R. Nandakumar ◽  
Irem Boybat ◽  
Jin-Ping Han ◽  
Stefano Ambrogio ◽  
Praneet Adusumilli ◽  
...  
Keyword(s):  
Deep Learning ◽  
Phase Change ◽  
Phase Change Memory ◽  
Memory Devices ◽  
Change Memory

Modeling of Atomic Migration Phenomena in Phase Change Memory Devices

2015 ◽  
Author(s):  
Luca Crespi ◽  
Andrea Lacaita ◽  
Mattia Boniardi ◽  
Enrico Varesi ◽  
Andrea Ghetti ◽  
...  
Keyword(s):  
Phase Change ◽  
Phase Change Memory ◽  
Memory Devices ◽  
Change Memory

Phase-change memory devices based on gallium-doped indium oxide

2009 ◽  
Vol 94 (11) ◽  
pp. 113503 ◽  
Author(s):  
S.-L. Wang ◽  
C.-Y. Chen ◽  
M.-K. Hsieh ◽  
W.-C. Lee ◽  
A. H. Kung ◽  
...  
Keyword(s):  
Phase Change ◽  
Indium Oxide ◽  
Phase Change Memory ◽  
Memory Devices ◽  
Change Memory

Holistic Integrated Process Solutions for Patterning Phase Change Memory Devices

2021 ◽  
Vol MA2021-01 (21) ◽  
pp. 846-846
Author(s):  
John Hoang ◽  
Meihua Shen ◽  
Thorsten Lill ◽  
Danna Qian ◽  
Aaron Routzahn ◽  
...  
Keyword(s):  
Phase Change ◽  
Phase Change Memory ◽  
Memory Devices ◽  
Integrated Process ◽  
Process Solutions ◽  
Change Memory

scholarly journals High Speed Test System of Current Pulse for Phase Change Memory Devices

2019 ◽  
Vol 1237 ◽  
pp. 042064
Author(s):  
Yuhan Wang ◽  
Ziqiang Zeng ◽  
Yuchan Wang ◽  
Xia Xu ◽  
Liangling Gu
Keyword(s):  
Phase Change ◽  
Current Pulse ◽  
High Speed ◽  
Phase Change Memory ◽  
Test System ◽  
Memory Devices ◽  
Speed Test ◽  
Change Memory
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