Joint Soft-Error-Rate (SER) Estimation for Combinational Logic and Sequential Elements

2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ◽

10.1109/isvlsi.2016.28 ◽

2016 ◽

Cited By ~ 7

Author(s):

Ji Li ◽

Jeffrey Draper

Keyword(s):

Error Rate ◽

Soft Error ◽

Combinational Logic ◽

Soft Error Rate

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Modeling the effect of technology trends on the soft error rate of combinational logic

Proceedings International Conference on Dependable Systems and Networks ◽

10.1109/dsn.2002.1028924 ◽

2003 ◽

Cited By ~ 804

Author(s):

P. Shivakumar ◽

M. Kistler ◽

S.W. Keckler ◽

D. Burger ◽

L. Alvisi

Keyword(s):

Error Rate ◽

Soft Error ◽

Combinational Logic ◽

Soft Error Rate ◽

Technology Trends

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Soft Error Rate Analysis for Combinational Logic Using an Accurate Electrical Masking Model

IEEE Transactions on Dependable and Secure Computing ◽

10.1109/tdsc.2009.29 ◽

2011 ◽

Vol 8 (1) ◽

pp. 137-146 ◽

Cited By ~ 38

Author(s):

Feng Wang ◽

Yuan Xie

Keyword(s):

Error Rate ◽

Soft Error ◽

Combinational Logic ◽

Soft Error Rate ◽

Rate Analysis

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Computing the Soft Error Rate of a Combinational Logic Circuit Using Parameterized Descriptors

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2007.891036 ◽

2007 ◽

Vol 26 (3) ◽

pp. 468-479 ◽

Cited By ~ 74

Author(s):

Rajeev R. Rao ◽

Kaviraj Chopra ◽

David T. Blaauw ◽

Dennis M. Sylvester

Keyword(s):

Error Rate ◽

Logic Circuit ◽

Soft Error ◽

Combinational Logic ◽

Soft Error Rate ◽

Combinational Logic Circuit

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Impact of technology scaling on the combinational logic soft error rate

2014 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2014.6861093 ◽

2014 ◽

Cited By ~ 20

Author(s):

N. N. Mahatme ◽

N. J. Gaspard ◽

T. Assis ◽

S. Jagannathan ◽

I. Chatterjee ◽

...

Keyword(s):

Error Rate ◽

Soft Error ◽

Combinational Logic ◽

Technology Scaling ◽

Soft Error Rate ◽

Impact Of Technology

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A Layout-Based Soft Error Rate Estimation and Mitigation in the Presence of Multiple Transient Faults in Combinational Logic

2020 21st International Symposium on Quality Electronic Design (ISQED) ◽

10.1109/isqed48828.2020.9137014 ◽

2020 ◽

Cited By ~ 1

Author(s):

Christos Georgakidis ◽

Georgios Ioannis Paliaroutis ◽

Nikolaos Sketopoulos ◽

Pelopidas Tsoumanis ◽

Christos Sotiriou ◽

...

Keyword(s):

Error Rate ◽

Soft Error ◽

Combinational Logic ◽

Transient Faults ◽

Soft Error Rate ◽

Rate Estimation

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Soft Error Rate Analysis for Combinational Logic Using An Accurate Electrical Masking Model

20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) ◽

10.1109/vlsid.2007.145 ◽

2007 ◽

Cited By ~ 13

Author(s):

Feng Wang ◽

Yuan Xie ◽

R. Rajaraman ◽

B. Vaidyanathan

Keyword(s):

Error Rate ◽

Soft Error ◽

Combinational Logic ◽

Soft Error Rate ◽

Rate Analysis

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High-accuracy estimation of soft error rate using PHYSERD with circuit simulation

2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ◽

10.1109/sispad.2014.6931634 ◽

2014 ◽

Cited By ~ 2

Author(s):

Takashi Kato ◽

Taiki Uemura ◽

Hideya Matsuyama

Keyword(s):

Error Rate ◽

Circuit Simulation ◽

High Accuracy ◽

Soft Error ◽

Accuracy Estimation ◽

Soft Error Rate

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CLEAR: A Cross-Layer Soft Error Rate Reduction method based on mitigating DETs in nanoscale combinational logics

Microprocessors and Microsystems ◽

10.1016/j.micpro.2021.104282 ◽

2021 ◽

pp. 104282

Author(s):

Amir M. Hajisadeghi ◽

Hamid R. Zarandi

Keyword(s):

Error Rate ◽

Reduction Method ◽

Soft Error ◽

Cross Layer ◽

Rate Reduction ◽

Soft Error Rate

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Underground characterization and modeling of alpha-particle induced Soft-Error Rate in CMOS 65nm SRAM

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131359 ◽

2011 ◽

Cited By ~ 1

Author(s):

S. Martinie ◽

J.L. Autran ◽

S. Sauze ◽

D. Munteanu ◽

S. Uznanski ◽

...

Keyword(s):

Alpha Particle ◽

Error Rate ◽

Soft Error ◽

Soft Error Rate

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Cosmic ray induced soft error rate in VLSI circuits

IEEE Electron Device Letters ◽

10.1109/edl.1983.25694 ◽

1983 ◽

Vol 4 (6) ◽

pp. 172-174 ◽

Cited By ~ 10

Author(s):

G.A. Sai-Halasz

Keyword(s):

Error Rate ◽

Cosmic Ray ◽

Vlsi Circuits ◽

Soft Error ◽

Soft Error Rate

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