A 1.0V/sub DD/ CMOS active pixel image sensor with complementary pixel architecture fabricated with a 0.25μm CMOS process

2005 ◽  
Author(s):  
Chen Xu ◽  
Weiquan Zhang ◽  
Mansun Chan
Keyword(s):  
Image Sensor ◽  
Cmos Process ◽  
Active Pixel ◽  
Pixel Image

Readout circuit for CMOS active pixel image sensor

2002 ◽  
Vol 38 (7) ◽  
pp. 317 ◽  
Author(s):  
T. Kwok ◽  
J.J. Zhong ◽  
T. Wilkinson ◽  
W.A. Crossland
Keyword(s):  
Image Sensor ◽  
Readout Circuit ◽  
Active Pixel ◽  
Pixel Image

Total Dose Effects in 0.5 μm CMOS Active Pixel Image Sensor

2015 ◽  
Vol 36 (2) ◽  
pp. 242-248 ◽  
Author(s):  
汪波 WANG Bo ◽  
李豫东 LI Yu-dong ◽  
郭旗 GUO Qi ◽  
刘昌举 LIU Chang-ju ◽  
文林 WEN Lin ◽  
...  
Keyword(s):  
Total Dose ◽  
Image Sensor ◽  
Active Pixel ◽  
Dose Effects ◽  
Total Dose Effects ◽  
Pixel Image

CMOS active pixel image sensor with simple floating gate pixels

1995 ◽  
Vol 42 (9) ◽  
pp. 1693-1694 ◽  
Author(s):  
J. Nakamura ◽  
S.E. Kemeny ◽  
E.R. Fossum
Keyword(s):  
Image Sensor ◽  
Floating Gate ◽  
Active Pixel ◽  
Pixel Image

A Stacked CMOS Active Pixel Image Sensor for Charge Particle Detection and the Application to SIMS

1999 ◽  
Vol 5 (S2) ◽  
pp. 370-371
Author(s):  
H. Yurimoto ◽  
K. Nagashima ◽  
T. Kunihiro ◽  
I. Takayanagi ◽  
J. Nakamura ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Detection System ◽  
Image Sensor ◽  
Two Dimensional ◽  
Particle Detection ◽  
Visible Image ◽  
Two Dimensional Image ◽  
Active Pixel ◽  
Channel Plate ◽  
Pixel Image

A stacked CMOS active pixel image-sensor (APS) has been developed for detecting various kinds of charged particles and its noise performance has been measured and analyzed. The sensitivity for ions and electrons with keV energy level utilizes for ion microscopy such-as SIMS and electron microscopy, respectively.Charge particles such as ions and electrons with kinetic energy of keV order are useful probes for surface analysis of material. A measurement system which yields two-dimensional image of charge particles is highly demanded. The conventional two-dimensional detection system is composed of a micro channel plate, a florescent plate which receives multiplied secondary electrons and generates a visible image, and a visible image sensor. However, its limited dynamic range and non-linearity in the ion-electron-to-photon conversion process make a quantitative measurement difficult. The proposed system using a stacked CMOS APS has several advantages over the conventional system such as high spatial resolution, no insensitive time, high S/N, wide dynamic range, nondestructive readout capability, high robustness, and low power consumption.

scholarly journals Digital CMOS active pixel image sensor for multimedia applications

1996 ◽  
Author(s):  
Zhimin Zhou ◽  
Bedabrata Pain ◽  
Jason C. Woo ◽  
Eric R. Fossum
Keyword(s):  
Image Sensor ◽  
Multimedia Applications ◽  
Digital Cmos ◽  
Active Pixel ◽  
Pixel Image

Investigation of Single-Transistor Active Pixel Image Sensor Compatible with Dual-Poly-Gate Technology

2012 ◽  
Author(s):  
Xin-Yan Liu ◽  
Xi Lin ◽  
Cheng-Wei Cao ◽  
Qing-Qing Sun ◽  
Paul-Chang Lin ◽  
...  
Keyword(s):  
Image Sensor ◽  
Active Pixel ◽  
Pixel Image
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