Amendment of Cavity Perturbation Technique for Loss Tangent Measurement at Microwave Frequencies

2006 7th International Symposium on Antennas, Propagation & EM Theory ◽

10.1109/isape.2006.353221 ◽

2006 ◽

Author(s):

Jyh Sheen

Keyword(s):

Loss Tangent ◽

Perturbation Technique ◽

Microwave Frequencies ◽

Cavity Perturbation

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Amendment of cavity perturbation technique for loss tangent measurement at microwave frequencies

Journal of Applied Physics ◽

10.1063/1.2751484 ◽

2007 ◽

Vol 102 (1) ◽

pp. 014102 ◽

Cited By ~ 49

Author(s):

Jyh Sheen

Keyword(s):

Loss Tangent ◽

Perturbation Technique ◽

Microwave Frequencies ◽

Cavity Perturbation

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Measurement of Dielectric Parameters at Microwave Frequencies by Cavity-Perturbation Technique

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.1979.1129731 ◽

1979 ◽

Vol 27 (9) ◽

pp. 791-795 ◽

Cited By ~ 90

Author(s):

A. Parkash ◽

J.K. Vaid ◽

A. Mansingh

Keyword(s):

Perturbation Technique ◽

Dielectric Parameters ◽

Microwave Frequencies ◽

Cavity Perturbation

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Dielectric measurements on substrate materials at microwave frequencies using a cavity perturbation technique

Journal of Applied Physics ◽

10.1063/1.341024 ◽

1988 ◽

Vol 63 (7) ◽

pp. 2466-2468 ◽

Cited By ~ 108

Author(s):

D. C. Dube ◽

M. T. Lanagan ◽

J. H. Kim ◽

S. J. Jang

Keyword(s):

Perturbation Technique ◽

Dielectric Measurements ◽

Microwave Frequencies ◽

Cavity Perturbation

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Measurements of dielectric properties of TiO2 thin films at microwave frequencies using an extended cavity perturbation technique

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-009-9999-8 ◽

2009 ◽

Vol 21 (8) ◽

pp. 817-821 ◽

Cited By ~ 7

Author(s):

Jyh Sheen ◽

Chueh-Yu Li ◽

Liang-Wen Ji ◽

Wei-Lung Mao ◽

Weihsing Liu ◽

...

Keyword(s):

Thin Films ◽

Dielectric Properties ◽

Perturbation Technique ◽

Tio2 Thin Films ◽

Microwave Frequencies ◽

Cavity Perturbation ◽

Extended Cavity

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Study of Highly Anisotropic Conductivity and Penetration Depth of Bi2Sr2CaCu2O y by Using a Cavity Perturbation Technique

Advances in Superconductivity XII ◽

10.1007/978-4-431-66877-0_5 ◽

2000 ◽

pp. 26-28 ◽

Cited By ~ 1

Author(s):

H. Kitano ◽

K. Kinoshita ◽

Y. Tsuchiya ◽

K. Iwaya ◽

R. Abiru ◽

...

Keyword(s):

Penetration Depth ◽

Perturbation Technique ◽

Anisotropic Conductivity ◽

Cavity Perturbation

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Extended cavity perturbation technique to determine the complex permittivity of dielectric materials

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/22.473190 ◽

1995 ◽

Vol 43 (11) ◽

pp. 2633-2636 ◽

Cited By ~ 58

Author(s):

Binshen Meng ◽

J. Booske ◽

R. Cooper

Keyword(s):

Complex Permittivity ◽

Perturbation Technique ◽

Dielectric Materials ◽

Cavity Perturbation ◽

Extended Cavity

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The More Accurate Method to Extract Dielectric Constant and Loss Tangent of Insulated Material on Microwave Frequencies

2005 7th Electronic Packaging Technology Conference ◽

10.1109/eptc.2005.1614509 ◽

2006 ◽

Author(s):

Chia-Hsing Chou ◽

Pao-Nan Li ◽

Sung-Mao Wu

Keyword(s):

Dielectric Constant ◽

Loss Tangent ◽

Accurate Method ◽

Microwave Frequencies ◽

Dielectric Constant And Loss

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Dielectric Properties of Foods at 3 GHz as Determined by a Cavity Perturbation Technique.

Journal of Microwave Power ◽

10.1080/00222739.1971.11688789 ◽

1971 ◽

Vol 6 (2) ◽

pp. 107-123 ◽

Cited By ~ 135

Author(s):

N. E. Bengtsson ◽

P. O. Risman

Keyword(s):

Dielectric Properties ◽

Perturbation Technique ◽

Cavity Perturbation

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Temperature Dependence of Relative Permittivity and Loss Tangent of Novel Transparent Substrate Material at Microwave Frequencies

Electromagnetic Materials ◽

10.1142/9789812704344_0045 ◽

2003 ◽

Author(s):

J. Mazierska ◽

M. V. Jacob ◽

T. F. Au Yeung

Keyword(s):

Temperature Dependence ◽

Loss Tangent ◽

Relative Permittivity ◽

Substrate Material ◽

Microwave Frequencies ◽

Transparent Substrate

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RF Characterization of Magnetodielectric Material Using Cavity Perturbation Technique

IEEE Transactions on Components Packaging and Manufacturing Technology ◽

10.1109/tcpmt.2015.2465383 ◽

2015 ◽

Vol 5 (12) ◽

pp. 1850-1859 ◽

Cited By ~ 17

Author(s):

Kyu Han ◽

Madhavan Swaminathan ◽

Raj Pulugurtha ◽

Himani Sharma ◽

Rao Tummala ◽

...

Keyword(s):

Perturbation Technique ◽

Cavity Perturbation

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