Dielectric measurements on substrate materials at microwave frequencies using a cavity perturbation technique

1988 ◽  
Vol 63 (7) ◽  
pp. 2466-2468 ◽  
Author(s):  
D. C. Dube ◽  
M. T. Lanagan ◽  
J. H. Kim ◽  
S. J. Jang
Sign in / Sign up

Export Citation Format

Share Document