Drain current model based on the Meyer-Neldel Rule for polycrystalline ZnO thin-film transistors at different temperatures

Author(s):  
Hongyu He ◽  
Yuan Liu ◽  
Binghui Yan ◽  
Xinnan Lin ◽  
Xueren Zheng ◽  
...  
2013 ◽  
Vol 114 (18) ◽  
pp. 184502 ◽  
Author(s):  
A. Tsormpatzoglou ◽  
N. A. Hastas ◽  
N. Choi ◽  
F. Mahmoudabadi ◽  
M. K. Hatalis ◽  
...  

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