Drain current model based on the Meyer-Neldel Rule for polycrystalline ZnO thin-film transistors at different temperatures
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2016 ◽
Vol 63
(11)
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pp. 4423-4431
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2012 ◽
Vol 29
(9)
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pp. 097301
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2017 ◽
Vol 64
(9)
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pp. 3654-3660
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2018 ◽
Vol 1141
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pp. 012066
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2017 ◽
Vol 57
(1)
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pp. 014301
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2013 ◽
Vol 60
(3)
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pp. 1122-1127
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