Nanoscale physical analysis of localized breakdown events in HfO2/SiOX dielectric stacks: A correlation study of STM induced BD with C-AFM and TEM

2012 ◽  
Author(s):  
K. Shubhakar ◽  
K. L. Pey ◽  
M. Bosman ◽  
R. Thamankar ◽  
S. S. Kushvaha ◽  
...  
Keyword(s):  
Correlation Study ◽  
Physical Analysis

Photon correlation study of spermatozoa motility

1979 ◽  
Vol 40 (11) ◽  
pp. 1085-1088 ◽  
Author(s):  
B. Herpigny ◽  
J.-P. Boon
Keyword(s):  
Correlation Study ◽  
Photon Correlation ◽  
Spermatozoa Motility

Modern Day Trojan Horse

2020 ◽  
Vol 5 (1) ◽  
pp. 33-37
Author(s):  
Zahra Sina ◽  
Nadia Abdullahi
Keyword(s):  
Young Adults ◽  
Life Cycle ◽  
Daily Basis ◽  
Correlation Study ◽  
Trojan Horse ◽  
Female Students ◽  
Personal Hygiene ◽  
The Public

Personal hygiene products are used on a daily basis by many people. Many are comparable to the Trojan horse. On the outside, they appear to be harmless. They are contained in attractive bottles and they rely on misleading ads to attract consumers. However, these products may contain potentially harmful chemicals and many people are unaware of how individuals, societies and environments are affected in the various stages of the life cycle of many personal hygiene products. Our STSE issue deals with an everyday product that falls under the Trojan horse analogy–lotion. We are concerned that our peers and other young adults are purchasing lotions without the knowledge of how they came to stand on the shelves of a store. We conducted a correlation study between gender and popular lotion brands among teenagers and the reasons behind their choices. We came to the conclusion that more females than males were interested in popular lotion brands due to enticing features that targets mainly feminine interests (e.g. scent is an aspect of lotion that more females than males consider when purchasing the brand). For our actions, we prepared an educational mind-map on our issue and a video compilation where we interviewed female students on their reactions to various lotion brand commercials. Our actions are meant to inform the public about the controversies surrounding our issue and the techniques companies use to gain the attention of potential consumers.

Intracerebral Hematoma, Perihemorrhagic Edema and Urinary Excreted Cysteinyl Leukotrienes Correlation Study

2014 ◽  
Vol 68 (2) ◽  
pp. 85-88
Author(s):  
Natalija Dolnenec-Baneva ◽  
Dijana Nikodijevic ◽  
Gordana Kiteva-Trenchevska ◽  
Igor Petrov ◽  
Dragana Petrovska-Cvetkovska ◽  
...  
Keyword(s):  
Intracerebral Hemorrhage ◽  
Brain Edema ◽  
Correlation Study ◽  
Intracerebral Hematoma ◽  
Moderate Correlation ◽  
Hematoma Volume ◽  
Cysteinyl Leukotrienes ◽  
Edema Volume ◽  
Perihemorrhagic Edema

AbstractIntroduction.Several mechanisms in formation of perihemorrhagic edema are activated after contact of brain tissue-extravasated blood in intracerebral hemorrhage. Cysteinyl leukotrienes (cysLT) (C4, D4, E4) are included in this process as significant edema factors and they determine the neurological deficit and outcome. The study aim was a 5-day follow-up (admission/3 day/5 day) of urinary cysLT, hematoma volume, edema volume values and their correlation in patients after spontaneous, primary supratentorial intracerebral hemorrhage.Methods.An enzyme immunoassay was used for urinary cysLT measured in 62 patients and 80 healthy controls. Hematoma and edema volumes were visualized and measured by computed tomography and mathematically calculated with a special spheroid shape formula (V=AxBxC/2).Results.CysLT of hemorrhagic patients (1842.20±1413.2, 1181.54±906.2, 982.30±774.2pg/ml/mg creatinine) were significantly excreted (p<0.01). Brain edema (12.86±13.5, 22.38±21.1, 28.45±29.4cm3) was significantly increased (p<0.01). Hematoma volume values (13.05±14.5, 13.13±14.7, 12.99±14.7cm3) were not significant (p>0.05). A high correlation (multiple regression) between cysLT, hematoma and edema was found on the 3rdday (R=0.6) and a moderate correlation at admission (R=0.3) and on the 5thday (R=0.3).Conclusion.In our 5-day follow-up study a significant cysLT brain synthesis and significant brain edema progression versus constant hematoma volume values in hemorrhagic patients was found. A high correlation between cysLT, hematoma and edema volume was found on the 3rdday, a moderate correlation on admission and on the 5thday, which means that high cysLT and hematoma values were associated with high/moderate edema values.

From whom do we learn group norms? Low-ranking group members are perceived as the best sources

2020 ◽  
Author(s):  
Jennifer E Dannals ◽  
Emily Reit ◽  
Dale T. Miller
Keyword(s):  
Social Norms ◽  
Correlation Study ◽  
Team Members ◽  
Norm Perception ◽  
Lower Ranking ◽  
Group Members ◽  
Groups And Teams ◽  
Or Team ◽  
And Behavior ◽  
To Receive

Social norm perception is ubiquitous in small groups and teams, but how individuals approach this process is not well understood. When individuals wish to perceive descriptive social norms in a group or team, whose ad- vice and behavior do they prefer to rely on? Four lab studies and one Teld survey demonstrate that when in- dividuals seek information about a team’s social norms they prefer to receive advice from lower-ranking indi- viduals (Studies 1–4) and give greater weight to the observed behavior of lower-ranking individuals (Study 5). Results from correlation (Study 3) and moderation (Study 4) approaches suggest this preference stems from the assumption that lower-ranking team members are more attentive to and aware of the descriptive social norms of their team. Alternative mechanisms (e.g., perceived similarity to lower-ranking team members, greater honesty of lower-ranking team members) were also examined, but no support for these was found.

The Novel Dopant Profile Inspection Methodology by FIB

2010 ◽  
Author(s):  
Po Fu Chou ◽  
Li Ming Lu
Keyword(s):  
High Resolution ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Real Sample ◽  
Physical Analysis ◽  
The Novel ◽  
High Contrast ◽  
Dopant Profile ◽  
P Type

Abstract Dopant profile inspection is one of the focused ion beam (FIB) physical analysis applications. This paper presents a technique for characterizing P-V dopant regions in silicon by using a FIB methodology. This technique builds on published work for backside FIB navigation, in which n-well contrast is observed. The paper demonstrates that the technique can distinguish both n- and p-type dopant regions. The capability for imaging real sample dopant regions on current fabricated devices is also demonstrated. SEM DC and FIB DC are complementary methodologies for the inspection of dopants. The advantage of the SEM DC method is high resolution and the advantage of FIB DC methodology is high contrast, especially evident in a deep N-well region.

The Electrical Characterization and Physical Failure Analysis for Transistor Gate Leakage

2006 ◽  
Author(s):  
Tsung-Te Li ◽  
Chao-Chi Wu ◽  
Jung-Hsiang Chuang ◽  
Jon C. Lee
Keyword(s):  
Failure Analysis ◽  
Electrical Characterization ◽  
Physical Analysis ◽  
Gate Leakage ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Voltage Stress ◽  
Leakage Site

Abstract This article describes the electrical and physical analysis of gate leakage in nanometer transistors using conducting atomic force microscopy (C-AFM), nano-probing, transmission electron microscopy (TEM), and chemical decoration on simulated overstressed devices. A failure analysis case study involving a soft single bit failure is detailed. Following the nano-probing analysis, TEM cross sectioning of this failing device was performed. A voltage bias was applied to exaggerate the gate leakage site. Following this deliberate voltage overstress, a solution of boiling 10%wt KOH was used to etch decorate the gate leakage site followed by SEM inspection. Different transistor leakage behaviors can be identified with nano-probing measurements and then compared with simulation data for increased confidence in the failure analysis result. Nano-probing can be used to apply voltage stress on a transistor or a leakage path to worsen the weak point and then observe the leakage site easier.

Failure Analysis Due to Slightly Unetched Hard Mask Using Nano Probe

2013 ◽  
Author(s):  
Jong Hak Lee ◽  
Jong Eun Kim ◽  
Chang Su Park ◽  
Nam Il Kim ◽  
Jang Won Moon ◽  
...  
Keyword(s):  
Leakage Current ◽  
Circuit Simulation ◽  
The State ◽  
Physical Analysis ◽  
Cross Sectional ◽  
Hard Mask ◽  
Current Flows ◽  
Voltage Contrast ◽  
The One ◽  
Zero Voltage

Abstract In this work, a slightly unetched gate hard mask failure was analyzed by nano probing. Although unetched hard mask failures are commonly detected from the cross sectional view with FIB or FIB-TEM and planar view with the voltage contrast, in this case of the very slightly unetched hard mask, it was difficult to find the defects within the failed area by physical analysis methods. FIB is useful due to its function of milling and checking from the one region to another region within the suspected area, but the defect, located under contact was very tiny. So, it could not be detected in the tilted-view of the FIB. However, the state of the failure could be understood from the electrical analysis using a nano probe due to its ability to probe contact nodes across the fail area. Among the transistors in the fail area, one transistor’s characteristics showed higher leakage current and lower ON current than expected. After physical analysis, slightly remained hard mask was detected by TEM. Chemical processing was followed to determine the gate electrode (WSi2) connection to tungsten contact. It was also proven that when gate is floated, more leakage current flows compared to the state that the zero voltage is applied to the gate. This was not verified by circuit simulation due to the floating nodes.

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