Die-level leakage current path analysis based on IR-OBIRCH technology
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2019 ◽
Vol 26
(2)
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pp. 196-205
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2008 ◽
Vol 27
(8)
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pp. 1363-1375
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2009 ◽
Vol 156
(5)
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pp. H384
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2018 ◽
Vol 8
(3)
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pp. 29
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