Effect of 0.05% Cr on intermetallic compound layer growth for Sn-Ag-Cu Lead-free Solder joint during isothermal aging

2009 ◽  
Author(s):  
Guobiao Su ◽  
Yongjiu Han ◽  
Chunyan Wang ◽  
Hongbin Wang ◽  
Xicheng Wei
Keyword(s):  
Intermetallic Compound ◽  
Solder Joint ◽  
Isothermal Aging ◽  
Compound Layer ◽  
Layer Growth ◽  
Lead Free ◽  
Intermetallic Compound Layer ◽  
Lead Free Solder ◽  
Free Solder

Effect of Isothermal Aging on the Growth and Morphology of the Intermetallic Compounds Formed at the Solder/Cu Interface of the Lead - Free Solder Joint

2007 ◽  
Vol 561-565 ◽  
pp. 2115-2118
Author(s):  
Yun Fu ◽  
Qi Zhang ◽  
Feng Sun ◽  
Hao Yu Bai
Keyword(s):  
Solder Joint ◽  
Intermetallic Compounds ◽  
Aging Time ◽  
Isothermal Aging ◽  
Lead Free ◽  
Intermetallic Compound Layer ◽  
Lead Free Solder ◽  
Cu Substrate ◽  
Cu6sn5 Layer ◽  
Free Solder

The growth and morphology of the intermetallic compounds (IMC) formed at the interface between the solder ( Sn–3.5Ag–0.5Cu ) and the Cu substrate of the lead - free solder joint have been investigated by means of isothermal aging at 125°C. The scalloped Cu6Sn5 intermetallic compound layer was formed at the interface between the solder and Cu substrate upon reflow. The thickness of Cu6Sn5 layer increased with aging time. Cu3Sn appeared between Cu6Sn5 layer and Cu substrate when isothermally aged for 100 hours. Compare to Cu6Sn5 , the thickness of Cu3Sn was rather low, and nearly did not increase with aging time. In this paper, the comparison was made among the Sn-Pb and the Sn-Ag-Cu(SAC) solders which were pre-treated differently before soldering.

Cracking of the Intermetallic Compound Layer in Solder Joints Under Drop Impact Loading

2011 ◽  
Vol 133 (3) ◽  
Author(s):  
Tong An ◽  
Fei Qin
Keyword(s):  
Intermetallic Compound ◽  
Solder Joint ◽  
Impact Loading ◽  
Driving Force ◽  
Solder Joints ◽  
Compound Layer ◽  
Drop Impact ◽  
Lead Free ◽  
Intermetallic Compound Layer ◽  
Crack Driving Force

The significant difference between failure modes of lead-containing and lead-free solder joints under drop impact loading remains to be not well understood. In this paper, we propose a feasible finite element approach to model the cracking behavior of solder joints under drop impact loading. In the approach, the intermetallic compound layer/solder bulk interface is modeled by the cohesive zone model, and the crack driving force in the intermetallic compound layer is evaluated by computing the energy release rate. The numerical simulation of a board level package under drop impact loading shows that, for the lead-containing Sn37Pb solder joint, the damage in the vicinity of the intermetallic compound layer initiates earlier and is much greater than that in the lead-free Sn3.5Ag solder joint. This damage relieves the stress in the intermetallic compound layer and reduces the crack driving force in it and consequently alleviates the risk of the intermetallic compound layer fracturing.

Wetting and the reaction of multiwalled carbon nanotube-reinforced composite solder with a copper substrate

2013 ◽  
Vol 20 (4) ◽  
pp. 301-306 ◽  
Author(s):  
Her-Yueh Huang ◽  
Chung-Wei Yang ◽  
Sian-Ze Pan
Keyword(s):  
Carbon Nanotube ◽  
Composite Solder ◽  
Copper Substrate ◽  
Compound Layer ◽  
Multiwalled Carbon Nanotube ◽  
Lead Free ◽  
Intermetallic Compound Layer ◽  
Lead Free Solder ◽  
Multiwalled Carbon ◽  
Free Solder

AbstractIn this work, contact angle, spreading area, and isothermal aging tests were conducted to study the difference between Sn-3Ag-0.5Cu lead-free solder and its composite solder at different multiwalled carbon nanotube reinforcement volume fractions. The material interaction between the solder and the substrate at different aging temperatures and times was investigated using scanning electron microscopy elemental analysis. The experimental results indicated that the composite solder had a lower contact angle as well as good spreading area. An intermetallic compound layer was found between the solder and the copper substrate, and the thickness of this reaction layer increased with increasing aging temperature and time. Meanwhile, the intermetallic compound layer of multiwalled carbon nanotube reinforcement composite solder was thicker than that of the Sn-3Ag-0.5Cu lead-free solder. The composite solder with 0.1 vol% multiwalled carbon nanotube reinforcement addition exhibited better comprehensive properties than composite solders with other reinforcement volume fractions.

Intermetallic compound formation and mechanical property of Sn-Cu-xCr/Cu lead-free solder joint

2017 ◽  
Vol 728 ◽  
pp. 992-1001 ◽  
Author(s):  
Junghwan Bang ◽  
Dong-Yurl Yu ◽  
Yong-Ho Ko ◽  
Min-Su Kim ◽  
Hiroshi Nishikawa ◽  
...  
Keyword(s):  
Mechanical Property ◽  
Intermetallic Compound ◽  
Solder Joint ◽  
Lead Free ◽  
Lead Free Solder ◽  
Compound Formation ◽  
Intermetallic Compound Formation ◽  
Free Solder

Growth Kinetics of Intermetallic Compound and Interfacial Reactions in Pb-Free Flip Chip Solder Bump during Solid State Isothermal Aging

2005 ◽  
Vol 486-487 ◽  
pp. 273-276
Author(s):  
Dae Gon Kim ◽  
Hyung Sun Jang ◽  
Young Jig Kim ◽  
Seung Boo Jung
Keyword(s):  
Solid State ◽  
Intermetallic Compound ◽  
Growth Kinetics ◽  
Isothermal Aging ◽  
Flip Chip ◽  
Compound Layer ◽  
Layer Growth ◽  
Intermetallic Compound Layer ◽  
Temperature Range ◽  
Kinetics Of

In the present work, the growth kinetics of intermetallic compound layer formed in Sn-3.5Ag flip chip solder joints by solid-state isothermal aging was examined at temperatures between 80 and 150 °C for 0 to 60 days. The bumping for the flip chip devices was performed using an electroless under bump metallization. The quantitative analyses were performed on the intermetallic compound layer thickness as a function of aging time and aging temperature. The layer growth of the Ni3Sn4 intermetallic compound followed a parabolic law within a given temperature range. As a whole, because the value of the time exponent (n) is approximately equal to 0.5, the layer growth of the intermetallic compound was mainly controlled by diffusion mechanism in the temperature range studied. The apparent activation energy of the Ni3Sn4 intermetallic was 49.63 kJ/mol.

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