Diffraction intensity distribution of the cylindrical varied line-space reflection grating

2012 ◽  
Author(s):  
Wang Dong-hui ◽  
Li Bing-shi ◽  
Bao Yan
Keyword(s):  
Intensity Distribution ◽  
Diffraction Intensity ◽  
Line Space ◽  
Reflection Grating

An Analysis of Temporal Diffraction of a Chirped Femtosecond Laser Pulse by a Circle Aperture

2012 ◽  
Vol 263-266 ◽  
pp. 360-364
Author(s):  
Huai Sheng Wang
Keyword(s):  
Laser Pulse ◽  
Femtosecond Laser ◽  
Femtosecond Laser Pulse ◽  
Intensity Distribution ◽  
Diffraction Intensity ◽  
Central Frequency ◽  
Fresnel Number ◽  
Gaussian Curve ◽  
Central Direction ◽  
Temporal Intensity

An equation is put forward to calculate the temporal diffraction intensity distribution of a chirped femtosecond laser pulse when it incites a circle aperture. In the aperture central direction an analytic expression is given to calculate the temporal intensity distribution. Many factors such as the width of the laser pulse, the radius of the circle aperture, the Fresnel number at central frequency, time and the chirped coefficient of the laser pulse affect the temporal intensity. Number calculation shows that if the width of laser pulse is within a few tens of femtoseconds and Fresnel number at central frequency is much than twenty, the temporal diffraction intensity outline is not a Gaussian curve. While when the Fresnel number is less than ten and the chirped coefficient is small, the temporal intensity is an approximate Gaussian curve. If the chirped coefficient is large, the temporal intensity is not Gaussian distribution.

Simulation of Diffraction Intensity Distribution of a Superconductor Containing Stacking Faults in the Bi-Sr-Ca-Cu-O System

1988 ◽  
Vol 27 (Part 2, No. 9) ◽  
pp. L1665-L1668 ◽  
Author(s):  
Mitsuko Onoda ◽  
Shunji Takekawa ◽  
Hiroshi Nozaki ◽  
Akihiko Umezono ◽  
Eiji Takayama-Muromachi
Keyword(s):  
Intensity Distribution ◽  
Stacking Faults ◽  
Diffraction Intensity

Extreme UV measurements of a varied line-space Hitachi reflection grating: efficiency and scattering

1984 ◽  
Vol 23 (19) ◽  
pp. 3267_1 ◽  
Author(s):  
Jerry Edelstein ◽  
Michael C. Hettrick ◽  
Stanley Mrowka ◽  
Patrick Jelinsky ◽  
Christopher Martin
Keyword(s):  
Extreme Uv ◽  
Line Space ◽  
Reflection Grating

Materials characterization from diffraction intensity distribution in the γ-direction

2014 ◽  
Vol 29 (2) ◽  
pp. 113-117 ◽  
Author(s):  
Bob B. He
Keyword(s):  
Intensity Distribution ◽  
Crystal Size ◽  
Profile Analysis ◽  
Structure Refinement ◽  
Size Analysis ◽  
Phase Identification ◽  
X Ray Diffraction ◽  
Diffraction Intensity ◽  
X Ray ◽  
Orientation Relations

Two-dimensional X-ray diffraction (XRD2) pattern can be described by the diffraction intensity distribution in both 2θ and γ-directions. The XRD2 images can be reduced to two kinds of profiles: 2θ-profile and γ-profile. The 2θ-profile can be evaluated for phase identification, crystal structure refinement, and many applications with many existing algorithms and software. In order to evaluate the materials structure associated with the intensity distribution along γ-angle, either the XRD2 pattern should be directly analyzed or the γ-profile can be generated by 2θ-integration. A γ-profile contains information on texture, stress, crystal size, and crystal orientation relations. This paper introduces the concept and fundamental algorithms for stress, texture, and crystal size analysis by the γ-profile analysis.

scholarly journals The Displacement of the Diffraction Pattern in the Motion of the Medium

2019 ◽  
Vol 5 (4) ◽  
pp. 12-23
Author(s):  
A. Glushchenko ◽  
E. Glushchenko
Keyword(s):  
Diffraction Pattern ◽  
Intensity Distribution ◽  
Physical Nature ◽  
Zero Order ◽  
Diffraction Intensity ◽  
Measuring Techniques ◽  
The One ◽  
Analytical Relations ◽  
Moving Media ◽  
Substrate Medium

Diffraction of waves of different physical nature is one of the most important and studied phenomena of nature in connection with its versatile use in devices and measuring techniques. The influence of media motion on the diffraction pattern attracted the attention of researchers in connection with the development of the theory of electrodynamics of moving media and continues to attract attention in connection with a number of unsolved problems of physics. In this paper we consider a model of the diffraction of waves on the slit and lattice, located on a movable substrate (medium). Analytical relations for the calculation of the diffraction pattern intensity distribution are obtained. The significant influence of the medium motion on the diffraction pattern is established. The position of the zero-order maximum does not depend on the motion of the medium, on the one hand, the distance between the diffraction maxima decreases, on the other hand increases, until they disappear. The conditions under which the motion of the medium leads to an asymmetrical appearance of the diffraction intensity distribution, which is not observed in a stationary medium, are established. Generalized conditions of diffraction minima are obtained taking into account the motion of the medium. Shows the effect of the direction of the velocity of motion of the medium on the intensity of the diffraction pattern.

New method to measure domain-wall motion contribution to piezoelectricity: the case of PbZr0.65Ti0.35O3 ferroelectric

2020 ◽  
Vol 53 (4) ◽  
pp. 1039-1050
Author(s):  
Semën Gorfman ◽  
Hyeokmin Choe ◽  
Guanjie Zhang ◽  
Nan Zhang ◽  
Hiroko Yokota ◽  
...  
Keyword(s):  
Data Analysis ◽  
Domain Wall ◽  
Electric Field ◽  
Intensity Distribution ◽  
Wall Motion ◽  
Domain Wall Motion ◽  
Lattice Parameters ◽  
New Method ◽  
Diffraction Intensity ◽  
X Ray

A new data analysis routine is introduced to reconstruct the change in lattice parameters in individual ferroelastic domains and the role of domain-wall motion in the piezoelectric effect. Using special electronics for the synchronization of a PILATUS X-ray area detector with a voltage signal generator, the X-ray diffraction intensity distribution was measured around seven split Bragg peaks as a function of external electric field. The new data analysis algorithm allows the calculation of `extrinsic' (related to domain-wall motion) and `intrinsic' (related to the change in lattice parameters) contributions to the electric-field-induced deformation. Compared with previously existing approaches, the new method benefits from the availability of a three-dimensional diffraction intensity distribution, which enables the separation of Bragg peaks diffracted from differently oriented domain sets. The new technique is applied to calculate the extrinsic and intrinsic contributions to the piezoelectricity in a single crystal of the ferroelectric PbZr1−x Ti x O3 (x = 0.35). The root-mean-square value of the piezoelectric coefficient was obtained as 112 pC N−1. The contribution of the domain-wall motion is estimated as 99 pC N−1. The contribution of electric-field-induced changes to the lattice parameters averaged over all the domains is 71 pC N−1. The equivalent value corresponding to the change in lattice parameters in individual domains may reach up to 189 pC N−1.

Geometry and algorithms to expand 2θ coverage of a 2D detector

2018 ◽  
Vol 33 (2) ◽  
pp. 147-155
Author(s):  
Bob B. He
Keyword(s):  
Intensity Distribution ◽  
Crystal Size ◽  
Structure Refinement ◽  
Phase Identification ◽  
Two Dimensional ◽  
Diffraction Intensity ◽  
2D Pattern ◽  
Multiple Frames ◽  
Scanned Images ◽  
Diffraction Patterns

A two-dimensional (2D) diffraction pattern is an image representing the diffraction intensity distribution over the detected area. For data evaluations of various materials characterization, such as phase identification, stress, texture, and crystal size, this distribution is further converted into the intensity distribution over 2θ or γ angles. For many applications, especially phase analysis and structure refinement, it is crucial for the two-dimensional (2D) pattern to have a large 2θ range sufficient to cover as many diffraction rings as necessary. The 2θ range covered by a 2D detector is determined by the size of the detector active area and the detector distance from the sample. In order to expand the 2θ coverage with a given 2D detector, one may collect several 2D frames at various swing angles and then merge the multiple frames, or scan the 2D detector over the desired 2θ range during the data collection. This paper introduces the geometry and algorithms to produce accurate 2D diffraction patterns with expanded 2θ coverages from multiple images or scanned images.

An alternative method for data analysis in serial femtosecond crystallography

2014 ◽  
Vol 70 (6) ◽  
pp. 670-676 ◽  
Author(s):  
Tao Zhang ◽  
Yang Li ◽  
Lijie Wu
Keyword(s):  
Data Analysis ◽  
Intensity Distribution ◽  
Diffraction Data ◽  
Free Electron Laser ◽  
Atomic Resolution ◽  
Diffraction Intensity ◽  
Simulation Data ◽  
X Ray ◽  
Structure Factors ◽  
Serial Femtosecond Crystallography

Serial femtosecond crystallography (SFX) [Chapmanet al.(2011),Nature,470, 73–77], based on the X-ray free-electron laser, is a new and powerful tool for structure analysis at atomic resolution. This study proposes an extrapolation method for diffraction data analysis on the basis of diffraction intensity distribution in reciprocal space. Results show that this new method can restore SFX simulation data to structure factors that are more consistent with the structures used in simulation.

Extreme UV measurements of a varied line-space Hitachi reflection grating: efficiency and scattering; erratum

1985 ◽  
Vol 24 (2) ◽  
pp. 153
Author(s):  
Jerry Edelstein ◽  
Michael C. Hettrick ◽  
Stanley Mrowka ◽  
Patrick Jelinsky ◽  
Christopher Martin
Keyword(s):  
Extreme Uv ◽  
Line Space ◽  
Reflection Grating
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