Thermal Stress Analysis of Cu/Low-k Interconnects in 3D-IC Structures

Author(s):  
M. C. Hsieh ◽  
Yung-yu Hsu ◽  
Chao-liang Chang
2016 ◽  
Vol 163 ◽  
pp. 78-82 ◽  
Author(s):  
L. Wang ◽  
C. Xu ◽  
L. Lin ◽  
C. Yang ◽  
J. Wang ◽  
...  

2010 ◽  
Vol 46 (10) ◽  
pp. 889-895 ◽  
Author(s):  
Moisés M. Pariona ◽  
Josuel K. Rugenski ◽  
Manuel V. Canté ◽  
José E. Spinelli ◽  
Amauri Garcia

Sign in / Sign up

Export Citation Format

Share Document