Performance evaluation of the thin film area in an IC wafer fabrication system using Petri nets
1998 ◽
Vol 11
(3)
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pp. 358-373
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Keyword(s):
Keyword(s):
2007 ◽
Vol 14
(3)
◽
pp. 393-398
◽
2014 ◽
pp. 381-408
2011 ◽
Vol 9
(2)
◽
pp. 34-39
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Keyword(s):
1994 ◽
Vol 32
(4)
◽
pp. 917-932
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Keyword(s):
Keyword(s):
Keyword(s):