Design and implementation of an new Built-In Self-Test boundary scan architecture

Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442) ◽

10.1109/icm.2003.238299 ◽

2003 ◽

Cited By ~ 3

Author(s):

M.H. El-Mahlawy ◽

E.A. El-Sehely ◽

A.S. Ragab ◽

S. Anas

Keyword(s):

Boundary Scan ◽

Design And Implementation ◽

Self Test ◽

Built In Self Test

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An improved pattern generation for Built-in Self-test design based on boundary-scan reseeding

2009 International Conference on Communications, Circuits and Systems ◽

10.1109/icccas.2009.5250336 ◽

2009 ◽

Cited By ~ 1

Author(s):

Enmin Tan ◽

Wenwu Qian ◽

Yan Li

Keyword(s):

Pattern Generation ◽

Test Design ◽

Boundary Scan ◽

Self Test ◽

Built In Self Test

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Methods for boundary scan access of built-in self-test for field programmable gate arrays

Proceedings IEEE Southeastcon'99. Technology on the Brink of 2000 (Cat. No.99CH36300) ◽

10.1109/secon.1999.766126 ◽

2003 ◽

Cited By ~ 1

Author(s):

C. Hamilton ◽

S. Wijesuriya ◽

G. Gibson ◽

C. Stroud

Keyword(s):

Field Programmable Gate Arrays ◽

Boundary Scan ◽

Gate Arrays ◽

Field Programmable ◽

Programmable Gate Arrays ◽

Self Test ◽

Built In Self Test

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Boundary scan with built-in self-test

IEEE Design & Test of Computers ◽

10.1109/54.20388 ◽

1989 ◽

Vol 6 (1) ◽

pp. 36-44 ◽

Cited By ~ 29

Author(s):

C.S. Gloster ◽

F. Brglez

Keyword(s):

Boundary Scan ◽

Self Test ◽

Built In Self Test

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Generation, verification, and execution of boundary scan with built-in self-test hardware for VLSI

10.1109/mwscas.1989.101790 ◽

2003 ◽

Cited By ~ 1

Author(s):

C.A. Ryan ◽

H.L. Martin

Keyword(s):

Boundary Scan ◽

Self Test ◽

Built In Self Test

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Boundary scan with cellular-based built-in self-test

International Test Conference 1988 Proceeding@m_New Frontiers in Testing ◽

10.1109/test.1988.207791 ◽

2003 ◽

Cited By ~ 19

Author(s):

C.S. Gloster ◽

F. Brglez

Keyword(s):

Boundary Scan ◽

Self Test ◽

Built In Self Test

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Design and implementation of a parallel weighted random pattern and logic built in self test algorithm

Proceedings 1999 IEEE International Conference on Computer Design: VLSI in Computers and Processors (Cat. No.99CB37040) ◽

10.1109/iccd.1999.808423 ◽

2003 ◽

Cited By ~ 4

Author(s):

P. Chang ◽

B. Keller ◽

S. Paliwal

Keyword(s):

Random Pattern ◽

Design And Implementation ◽

Self Test ◽

Built In Self Test ◽

Test Algorithm

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Built-In Self Test and Boundary Scan Techniques

Digital Circuit Testing ◽

10.1016/b978-0-08-050434-6.50008-0 ◽

1991 ◽

pp. 146-190

Author(s):

Francis C. Wang

Keyword(s):

Boundary Scan ◽

Self Test ◽

Built In Self Test

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New Built-In Self-Test Boundary Scan Architectures for Digital Integrated Circuits in Industrial Applications

International Journal of Computer Applications ◽

10.5120/ijca2018917437 ◽

2018 ◽

Vol 182 (1) ◽

pp. 41-55

Author(s):

Mohamed H. ◽

Sherif Anas ◽

Winston Waller

Keyword(s):

Integrated Circuits ◽

Industrial Applications ◽

Boundary Scan ◽

Digital Integrated Circuits ◽

Self Test ◽

Built In Self Test

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Efficient test generation for built-in self-test boundary-scan template

10.1109/vtest.1991.208171 ◽

2002 ◽

Author(s):

P. Nagvajara ◽

M.G. Karpovsky ◽

L.B. Levitin

Keyword(s):

Test Generation ◽

Boundary Scan ◽

Efficient Test ◽

Self Test ◽

Built In Self Test

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Current and future manufacturing test solution strategies - iNEMI Boundary-scan and Built in Self Test (BIST) technology integration for future standardization

2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) ◽

10.1109/iemt.2012.6521823 ◽

2012 ◽

Author(s):

Zoe Conroy ◽

Jun Balangue ◽

Philip B. Geiger ◽

Steve Butkovich

Keyword(s):

Technology Integration ◽

Test Solution ◽

Boundary Scan ◽

Solution Strategies ◽

Manufacturing Test ◽

Self Test ◽

Built In Self Test

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