A Low Cost Single Microcontroller Hybrid Stepper Motor Controller and Drive with Adaptive Ripple Reduction Using Current Feedback

2006 ◽  
Author(s):  
Farid Sheikholeslam ◽  
Mehdi Habibi
Keyword(s):  
Low Cost ◽  
Stepper Motor ◽  
Current Feedback ◽  
Motor Controller ◽  
Ripple Reduction

scholarly journals Low-Cost Touchscreen Driven Programmable Dual Syringe Pump for Life Science Applications

2018 ◽  
Author(s):  
Valentina E. Garcia ◽  
Jamin Liu ◽  
Joseph L. DeRisi
Keyword(s):  
Life Science ◽  
Narrow Range ◽  
Low Cost ◽  
Stepper Motor ◽  
Raspberry Pi ◽  
Syringe Pump ◽  
Motor Controller ◽  
Python Scripting ◽  
A Cell ◽  
3D Printed

AbstractSyringe pumps are powerful tools able to automate routine laboratory practices that otherwise consume large amounts of manual labor time. Commercially available syringe pumps are expensive, difficult to customize, and often preset for a narrow range of operations. Here, we show how to build a programmable dual syringe pump (PDSP) that overcomes these limitations. The PDSP is driven by a Raspberry Pi paired with a stepper motor controller to allow maximal customization via Python scripting. The entire setup can be controlled by a touchscreen for use without a keyboard or mouse. Furthermore, the PDSP is structured around 3D printed parts, enabling users to change any component for their specific application. We demonstrate one application of the PDSP by using it to generate whole cell lysates using a cell homogenizer in an automated fashion.Specifications table

Low-cost Indirect Measurement Methods for Self-x Integrated Sensory Electronics for Industry 4.0

2020 ◽  
Vol 87 (s1) ◽  
pp. s79-s84
Author(s):  
Qummar Zaman ◽  
Senan Alraho ◽  
Andreas König
Keyword(s):  
Industry 4.0 ◽  
Degrees Of Freedom ◽  
Performance Metrics ◽  
Low Cost ◽  
Indirect Measurement ◽  
Measurement Methods ◽  
Instrumentation Amplifier ◽  
Performance Parameters ◽  
Current Feedback ◽  
Indirect Measurements

AbstractThe conventional method for testing the performance of reconfigurable sensory electronics of industry 4.0 relies on the direct measurement methods. This approach gives higher accuracy but at the price of extremely high testing cost and does not utilize the new degrees of freedom for measurement methods enabled by industry 4.0. In order to reduce the test cost and use available resources more efficiently, a primary approach, called indirect measurements or alternative testing has been proposed using a non-intrusive sensor. Its basic principle consists in using the indirect measurements, in order to estimate the sensory electronics performance parameters without measuring directly. The non-intrusive property of the proposed method offers better performance of the sensing electronics and virtually applicable to any sensing electronics. Efficiency is evaluated in terms of model accuracy by using six different classical metrics. It uses an indirect current-feedback instrumentation amplifier (InAmp) as a test vehicle to evaluate the performance parameters of the circuit. The device is implemented using CMOS 0.35 μm technology. The achieved maximum value of average expected error metrics is 0.24, and the lowest value of correlation performance metrics is 0.91, which represent an excellent efficiency of InAmp performance predictor.

Study on CMP Test Technology of 65 nm and below Node Wafers with Copper Interconnects

2012 ◽  
Vol 159 ◽  
pp. 297-301
Author(s):  
Ru Wang ◽  
Guo Feng Pan ◽  
Juan Wang ◽  
Rui Xia Yang ◽  
Yu Ling Liu
Keyword(s):  
Optical Measurement ◽  
Ph Value ◽  
Low Cost ◽  
Chelating Agent ◽  
Critical Dimension ◽  
Copper Interconnects ◽  
Current Feedback ◽  
Transmission Electron ◽  
Testing Technology ◽  
Point Detection

It is of significance to research high-removal efficiency and low-cost CMP process for the 65 nm and below node. Chemical mechanical polishing (CMP) can realize the planarization of the wafer with free defects, free contamination and below nanometer level roughness. Test project of CMP slurry is main contain of these detections such as pH value, chelating agent content, SiO2 gel particle size, ζ-potential detection and the observation by Transmission electron microscopy (TEM). End point detection method of pattern wafer CMP usually includes the non destructive optical measurement, motor current feedback measurement and polishing pad temperature test. The main problems of the measurement for pattern wafer CMP are critical dimension (CD), section, film thickness, defects and particles measurement. Some of the new type of testing technology, such as atomic force profiler (AFP), can be used to compare CMP effect, such as dishing, erosion, tungsten plugs, the height of steps and flatness of the wafer, which is significant for wafer CMP research.

A Microprocessor Stepper Motor Controller

1984 ◽  
Vol 25 (4) ◽  
pp. 123-129
Author(s):  
P. Seetharamaiah
Keyword(s):  
Stepper Motor ◽  
Motor Controller

Design of Stepper Motor Control System Based on LM3S2110

2013 ◽  
Vol 341-342 ◽  
pp. 920-923
Author(s):  
Yong Ming Wang ◽  
Guo Quan Zhu ◽  
Xin Yin Qiu
Keyword(s):  
Motor Control ◽  
Control System ◽  
Hardware Implementation ◽  
Software Process ◽  
Stepper Motor ◽  
Led Driver ◽  
Design Scheme ◽  
Motor Controller ◽  
Stepper Motor Control ◽  
Motor Control System

To improve the reliability of control system and reduce the components, a stepper motor controller is designed. The excogitation also affords corresponding hardware implementation methods and software process. The control system is with LM3S2110 as its core. The stepper motor is driven by DRV8813 and the interfacing technique between CH452 keyboard and LED driver are given. It turned out that the system can simplify the design scheme in a economical and reliable way.

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