A research of the Port-Hopping telecommunication techniques based on non-linear feedback shift register (NLFSR)

2011 IEEE International Conference on Automation and Logistics (ICAL) ◽

10.1109/ical.2011.6024738 ◽

2011 ◽

Cited By ~ 1

Author(s):

Xu Guo ◽

Xu Na

Keyword(s):

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Non Linear ◽

Feedback Shift Register

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Bit-serial test pattern generation by an accumulator behaving as a non-linear feedback shift register

Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) ◽

10.1109/olt.2002.1030199 ◽

2003 ◽

Cited By ~ 4

Author(s):

G. Dimitrakopoulos ◽

D. Nikolos ◽

D. Bakalis

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Test Pattern Generation ◽

Serial Test ◽

Non Linear ◽

Feedback Shift Register ◽

Bit Serial

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VLSI implementation of a non-linear feedback shift register for high-speed cryptography applications

Proceedings of the 20th symposium on Great lakes symposium on VLSI - GLSVLSI '10 ◽

10.1145/1785481.1785569 ◽

2010 ◽

Author(s):

Pey-Chang Kent Lin ◽

Sunil P. Khatri

Keyword(s):

High Speed ◽

Shift Register ◽

Vlsi Implementation ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Non Linear ◽

Feedback Shift Register

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The non-linear feedback shift-register as a built-in self-test (BIST) resource

International Test Conference 1988 Proceeding@m_New Frontiers in Testing ◽

10.1109/test.1988.207893 ◽

2003 ◽

Cited By ~ 3

Author(s):

P.N. Marinos

Keyword(s):

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Non Linear ◽

Feedback Shift Register ◽

Self Test ◽

Built In Self Test

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Test response compaction by an accumulator behaving as a multiple input non-linear feedback shift register

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) ◽

10.1109/test.2000.894277 ◽

2002 ◽

Cited By ~ 6

Author(s):

D. Bakalis ◽

D. Nikolos ◽

X. Kavousianos

Keyword(s):

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Test Response ◽

Multiple Input ◽

Non Linear ◽

Feedback Shift Register ◽

Test Response Compaction

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Linear feedback shift register and integer theory: a state-of-art approach in security issues over e-commerce

Electronic Commerce Research ◽

10.1007/s10660-021-09477-w ◽

2021 ◽

Author(s):

Anirban Bhowmik ◽

Sunil Karforma

Keyword(s):

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Security Issues ◽

Feedback Shift Register ◽

State Of Art

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Memristor-based linear feedback shift register based on material implication logic

2015 European Conference on Circuit Theory and Design (ECCTD) ◽

10.1109/ecctd.2015.7300100 ◽

2015 ◽

Cited By ~ 20

Author(s):

Mehri Teimoory ◽

Amirali Amirsoleimani ◽

Arash Ahmadi ◽

Shahpour Alirezaee ◽

Saeideh Salimpour ◽

...

Keyword(s):

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Material Implication ◽

Feedback Shift Register

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Optimal Multi-Step Linear Feedback Shift Register Design

Frequenz ◽

10.1515/freq.2003.57.11-12.248 ◽

2003 ◽

Vol 57 (11-12) ◽

Author(s):

Uwe Meyer-Bäse ◽

Javier Ramírez

Keyword(s):

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Feedback Shift Register

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Efficient linear feedback shift register design for pseudo exhaustive test generation in BIST

2011 3rd International Conference on Electronics Computer Technology ◽

10.1109/icectech.2011.5941621 ◽

2011 ◽

Cited By ~ 4

Author(s):

Nisha Haridas ◽

M. Nirmala Devi

Keyword(s):

Test Generation ◽

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Feedback Shift Register

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Implementation of pseudo linear feedback shift register physical unclonable function on silicon

2016 IEEE International Symposium on Circuits and Systems (ISCAS) ◽

10.1109/iscas.2016.7527351 ◽

2016 ◽

Cited By ~ 2

Author(s):

Yasuhiro Ogasahara ◽

Yohei Hori ◽

Hanpei Koike

Keyword(s):

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Physical Unclonable Function ◽

Feedback Shift Register

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Low Transition-Generalized Linear Feedback Shift Register Based Test Pattern Generator Architecture for Built-in-Self-Test

Journal of Computer Science ◽

10.3844/jcssp.2012.815.821 ◽

2012 ◽

Vol 8 (6) ◽

pp. 815-821 ◽

Cited By ~ 3

Author(s):

Madjid

Keyword(s):

Test Pattern ◽

Pattern Generator ◽

Shift Register ◽

Linear Feedback Shift Register ◽

Linear Feedback ◽

Feedback Shift Register ◽

Self Test ◽

Built In Self Test

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