SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs

11th International Symposium on High-Performance Computer Architecture ◽

10.1109/hpca.2005.29 ◽

2005 ◽

Cited By ~ 40

Author(s):

Feng Qin ◽

Shan Lu ◽

Yuanyuan Zhou

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