scholarly journals RF MEMS Switch with Wafer Level Package Utilizing Frit Glass Bonding

Author(s):  
M. Fujii ◽  
I. Kimura ◽  
T. Satoh ◽  
K. Imanaka
Author(s):  
Renu Sharma ◽  
Isha Yadav ◽  
Anupriya Katiyar ◽  
Milap Singh ◽  
Shaveta ◽  
...  

2011 ◽  
Vol 20 (1) ◽  
pp. 58-63
Author(s):  
Sung-Chan Kang ◽  
Yeon-Su Jang ◽  
Hyeon-Cheol Kim ◽  
Kuk-Jin Chun

2020 ◽  
Vol 96 (3s) ◽  
pp. 456-459
Author(s):  
И.В. Кулинич ◽  
И.М. Добуш ◽  
Д. Бобошко

Спроектирован и разработан СВЧ МЭМ-ключ до 25 ГГц на GaAs-подложке с медной металлизацией. Разработана технология корпусирования СВЧ МЭМ-ключа на уровне пластины, полностью совместимой с GaAs-технологией. Проведен расчет секции аттенюатора на основе СВЧ МЭМ-ключа в виде копланарной линии, по разработанной технологии изготовлена секция аттенюатора с коэффициентом ослабления 8 дБ на GaAs-подложке на основе СВЧ МЭМ-ключей. The paper highlights the RF MEMS switch up to 25 GHz on a GaAs substrate with copper metallization. A technology has been developed for packaging a RF MEMS switch at the wafer level, which is fully compatible with MMIC GaAs technology. The section of the attenuator based on the RF MEMS switch in the form of a coplanar line has been calculated, according to the developed technology, the section of the attenuator with the attenuation coefficient of 8dB on a GaAs substrate based on the RF MEMS switch has been manufactured.


2003 ◽  
Vol 26 (3) ◽  
pp. 318-326 ◽  
Author(s):  
L.L. Mercado ◽  
Tien-Yu Tom Lee ◽  
Shun-Meen Kuo ◽  
V. Hause ◽  
C. Amrine

2016 ◽  
Vol 2016 (CICMT) ◽  
pp. 000118-000121
Author(s):  
S. Gropp ◽  
M. Fischer ◽  
A. Frank ◽  
C. Schäffel ◽  
J. Müller ◽  
...  

Abstract The integration of MEMS sensors, microelectronics and RF circuits including RF-MEMS is still a challenging task but becomes crucial for the Internet of Things. A wafer-level silicon-ceramic composite substrate (called SiCer, Silicon-on-Ceramics) allows new options in smart system integration. SiCer substrates combine the benefits of two different worlds of materials. The silicon substrate is a suitable material to build active MEMS devices such as switches and resonators. The ceramic substrate, a Low Temperature Cofired Ceramic (LTCC), is well-known for RF circuit integration including resistors, capacitors and coils. Both materials are co-sintered into a monolithically composite substrate. Chemical and physical modification of the silicon interface allows a low-pressure sintering and therefore new techniques for generating buried cavities at the bond interface. A carbon paste is applied on the LTCC via screen printing. After sintering, this results in a defined cavity. To demonstrate the advantages of the buried cavities within SiCer substrates the fabrication process of a RF-MEMS switch is shown. The switch is intended for a switching matrix to select frequency bands in a mobile LTE receiver. A parallel-plate electrostatic actuation with in-plane movement has been selected. This type of switch allows a large displacement range and a low actuation voltage can be achieved.


Author(s):  
C. Ferrandon ◽  
F. Greco ◽  
E. Lagoutte ◽  
P. Descours ◽  
G. Enyedy ◽  
...  

Author(s):  
Selin Tolunay Wipf ◽  
Alexander Goritz ◽  
Matthias Wietstruck ◽  
Maurizio Cirillo ◽  
Christian Wipf ◽  
...  

2008 ◽  
Vol 44 (2) ◽  
pp. 118 ◽  
Author(s):  
J.-M. Kim ◽  
S. Lee ◽  
C.-W. Baek ◽  
Y. Kwon ◽  
Y.-K. Kim

2017 ◽  
Vol 2017 (NOR) ◽  
pp. 1-4
Author(s):  
Selin Tolunay Wipf ◽  
Alexander Göritz ◽  
Matthias Wietstruck ◽  
Maurizio Cirillo ◽  
Christian Wipf ◽  
...  

Abstract In this paper, the effect of silicon (Si) cap packaging on the BiCMOS embedded RF-MEMS switch performance is studied. The RF-MEMS switches are designed and fabricated in a 0.25μm SiGe BiCMOS technology for K-band (18 – 27 GHz) applications. The packaging is done based on a wafer-to-wafer bonding technique and the RF-MEMS switches are electrically characterized before and after the Si cap packaging. The experimental data shows the effect of the wafer-level Si cap package on the C-V and S-parameter measurements. The performed 3D FEM simulations prove that the low resistive Si cap, specifically 1 Ω·cm, results in a significant RF performance degradation of the RF-MEMS switch in terms of insertion loss.


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