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On-chip delay measurement circuit
2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)
◽
10.1109/ets.2012.6233014
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2012
◽
Cited By ~ 3
Author(s):
Abhishek Jain
◽
Andrea Veggetti
◽
Dennis Crippa
◽
Pierluigi Rolandi
Keyword(s):
Measurement Circuit
◽
Delay Measurement
◽
On Chip
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Cited By
References
Note: Wide-range and high-resolution on-chip delay measurement circuit with low supply-voltage sensitivity for SoC applications
Review of Scientific Instruments
◽
10.1063/1.4968533
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2016
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Vol 87
(11)
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pp. 116101
Author(s):
Duo Sheng
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Yu-Chan Hung
Keyword(s):
High Resolution
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Supply Voltage
◽
Voltage Sensitivity
◽
Measurement Circuit
◽
Delay Measurement
◽
Wide Range
◽
On Chip
◽
Low Supply Voltage
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A Low Area On-chip Delay Measurement System Using Embedded Delay Measurement Circuit
2010 19th IEEE Asian Test Symposium
◽
10.1109/ats.2010.65
◽
2010
◽
Cited By ~ 9
Author(s):
Kentaroh Katoh
◽
Kazuteru Namba
◽
Hideo Ito
Keyword(s):
Measurement System
◽
Measurement Circuit
◽
Low Area
◽
Delay Measurement
◽
On Chip
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A Low Overhead On-Chip Path Delay Measurement Circuit
2009 Asian Test Symposium
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10.1109/ats.2009.64
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2009
◽
Cited By ~ 16
Author(s):
Songwei Pei
◽
Huawei Li
◽
Xiaowei Li
Keyword(s):
Path Delay
◽
Measurement Circuit
◽
Delay Measurement
◽
On Chip
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On-Chip Delay Measurement Circuit for Reliability Characterization of SRAM
2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
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10.1109/isvlsi.2016.24
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2016
◽
Cited By ~ 2
Author(s):
Pankaj Verma
◽
Rohit Halba
◽
Hemant Patel
◽
Maryam Shojaei Baghini
Keyword(s):
Measurement Circuit
◽
Delay Measurement
◽
On Chip
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A Baseband Ultra-Low Noise SiGe:C BiCMOS 0.25μm Amplifier and its Application for an On-Chip Phase-Noise Measurement Circuit
2009 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems
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10.1109/smic.2009.4770516
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2009
◽
Author(s):
S. Godet
◽
E. Tournier
◽
O. Llopis
◽
A. Cathelin
◽
J. Juyon
Keyword(s):
Phase Noise
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Low Noise
◽
Noise Measurement
◽
Measurement Circuit
◽
On Chip
◽
Ultra Low Noise
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An on-die all-digital delay measurement circuit with 250fs accuracy
2012 Symposium on VLSI Circuits (VLSIC)
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10.1109/vlsic.2012.6243808
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2012
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Cited By ~ 10
Author(s):
Mozhgan Mansuri
◽
Bryan Casper
◽
Frank O'Mahony
Keyword(s):
Measurement Circuit
◽
Delay Measurement
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An On-chip Path Delay Measurement Sensor for Aging Monitoring
10.1109/asicon52560.2021.9620372
◽
2021
◽
Author(s):
Dongrong Zhang
◽
Qiang Ren
◽
Donglin Su
Keyword(s):
Path Delay
◽
Measurement Sensor
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Delay Measurement
◽
On Chip
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Area overhead reduction for small-delay defect detection using on-chip delay measurement
2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
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10.1109/icsict.2014.7021171
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2014
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Author(s):
Wenpo Zhang
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Kazuteru Namba
◽
Hideo Ito
Keyword(s):
Defect Detection
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Area Overhead
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Delay Measurement
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Small Delay
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On Chip
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Improving small-delay fault coverage for on-chip delay measurement
2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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10.1109/dft.2012.6378223
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2012
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Cited By ~ 4
Author(s):
Wenpo Zhang
◽
Kazuteru Namba
◽
Hideo Ito
Keyword(s):
Fault Coverage
◽
Delay Fault
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Delay Measurement
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Small Delay
◽
On Chip
Download Full-text
A High-Precision Wide Range On-Chip Path Delay Measurement
International Journal of Engineering Trends and Technology
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10.14445/22315381/ijett-v11p290
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2014
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Vol 11
(9)
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pp. 450-454
Author(s):
Neelufar Naheed Saudagar
◽
◽
Seema Deshmukh
Keyword(s):
High Precision
◽
Path Delay
◽
Delay Measurement
◽
Wide Range
◽
On Chip
Download Full-text
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