A Low Overhead On-Chip Path Delay Measurement Circuit

2009 Asian Test Symposium ◽

10.1109/ats.2009.64 ◽

2009 ◽

Cited By ~ 16

Author(s):

Songwei Pei ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Path Delay ◽

Measurement Circuit ◽

Delay Measurement ◽

On Chip

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An On-chip Path Delay Measurement Sensor for Aging Monitoring

10.1109/asicon52560.2021.9620372 ◽

2021 ◽

Author(s):

Dongrong Zhang ◽

Qiang Ren ◽

Donglin Su

Keyword(s):

Path Delay ◽

Measurement Sensor ◽

Delay Measurement ◽

On Chip

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A High-Precision Wide Range On-Chip Path Delay Measurement

International Journal of Engineering Trends and Technology ◽

10.14445/22315381/ijett-v11p290 ◽

2014 ◽

Vol 11 (9) ◽

pp. 450-454

Author(s):

Neelufar Naheed Saudagar ◽

◽

Seema Deshmukh

Keyword(s):

High Precision ◽

Path Delay ◽

Delay Measurement ◽

Wide Range ◽

On Chip

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Note: Wide-range and high-resolution on-chip delay measurement circuit with low supply-voltage sensitivity for SoC applications

Review of Scientific Instruments ◽

10.1063/1.4968533 ◽

2016 ◽

Vol 87 (11) ◽

pp. 116101

Author(s):

Duo Sheng ◽

Yu-Chan Hung

Keyword(s):

High Resolution ◽

Supply Voltage ◽

Voltage Sensitivity ◽

Measurement Circuit ◽

Delay Measurement ◽

Wide Range ◽

On Chip ◽

Low Supply Voltage

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A Low Area On-chip Delay Measurement System Using Embedded Delay Measurement Circuit

2010 19th IEEE Asian Test Symposium ◽

10.1109/ats.2010.65 ◽

2010 ◽

Cited By ~ 9

Author(s):

Kentaroh Katoh ◽

Kazuteru Namba ◽

Hideo Ito

Keyword(s):

Measurement System ◽

Measurement Circuit ◽

Low Area ◽

Delay Measurement ◽

On Chip

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Path-RO: A novel on-chip critical path delay measurement under process variations

2008 IEEE/ACM International Conference on Computer-Aided Design ◽

10.1109/iccad.2008.4681644 ◽

2008 ◽

Cited By ~ 53

Author(s):

Xiaoxiao Wang ◽

Mohammad Tehranipoor ◽

Ramyanshu Datta

Keyword(s):

Critical Path ◽

Process Variations ◽

Path Delay ◽

Critical Path Delay ◽

Delay Measurement ◽

On Chip

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A novel architecture for on-chip path delay measurement

2009 International Test Conference ◽

10.1109/test.2009.5355742 ◽

2009 ◽

Cited By ~ 16

Author(s):

Xiaoxiao Wang ◽

Mohammad Tehranipoor ◽

Ramyanshu Datta

Keyword(s):

Path Delay ◽

Delay Measurement ◽

On Chip

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On-chip delay measurement circuit

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2012.6233014 ◽

2012 ◽

Cited By ~ 3

Author(s):

Abhishek Jain ◽

Andrea Veggetti ◽

Dennis Crippa ◽

Pierluigi Rolandi

Keyword(s):

Measurement Circuit ◽

Delay Measurement ◽

On Chip

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On-Chip Delay Measurement Circuit for Reliability Characterization of SRAM

2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ◽

10.1109/isvlsi.2016.24 ◽

2016 ◽

Cited By ~ 2

Author(s):

Pankaj Verma ◽

Rohit Halba ◽

Hemant Patel ◽

Maryam Shojaei Baghini

Keyword(s):

Measurement Circuit ◽

Delay Measurement ◽

On Chip

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A High-Precision On-Chip Path Delay Measurement Architecture

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2011.2161353 ◽

2012 ◽

Vol 20 (9) ◽

pp. 1565-1577 ◽

Cited By ~ 18

Author(s):

Songwei Pei ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

High Precision ◽

Path Delay ◽

Delay Measurement ◽

On Chip

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A Baseband Ultra-Low Noise SiGe:C BiCMOS 0.25μm Amplifier and its Application for an On-Chip Phase-Noise Measurement Circuit

2009 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems ◽

10.1109/smic.2009.4770516 ◽

2009 ◽

Author(s):

S. Godet ◽

E. Tournier ◽

O. Llopis ◽

A. Cathelin ◽

J. Juyon

Keyword(s):

Phase Noise ◽

Low Noise ◽

Noise Measurement ◽

Measurement Circuit ◽

On Chip ◽

Ultra Low Noise

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