Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip

Author(s):  
Kihyuk Han ◽  
Joonsung Park ◽  
Jae Wook Lee ◽  
Jacob A. Abraham ◽  
Eonjo Byun ◽  
...  
Keyword(s):  
2010 ◽  
Vol E93-B (8) ◽  
pp. 2211-2214
Author(s):  
Bin SHENG ◽  
Pengcheng ZHU ◽  
Xiaohu YOU ◽  
Lan CHEN

2013 ◽  
Vol E96.B (3) ◽  
pp. 910-913 ◽  
Author(s):  
Kilhwan KIM ◽  
Jangyong PARK ◽  
Jihun KOO ◽  
Yongsuk KIM ◽  
Jaeseok KIM

Sign in / Sign up

Export Citation Format

Share Document