Soft-Error Rate Testing of Deep-Submicron Integrated Circuits

Author(s):  
T. Heijmen ◽  
A. Nieuwland
2005 ◽  
Vol 5 (3) ◽  
pp. 317-328 ◽  
Author(s):  
A. Lesea ◽  
S. Drimer ◽  
J.J. Fabula ◽  
C. Carmichael ◽  
P. Alfke

2018 ◽  
Vol 35 (6) ◽  
pp. 78-85
Author(s):  
M. Amin Sabet ◽  
Behnam Ghavami ◽  
Mohsen Raji

Sign in / Sign up

Export Citation Format

Share Document