Soft-Error Rate Testing of Deep-Submicron Integrated Circuits
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2017 ◽
Vol 798
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pp. 012209
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2005 ◽
Vol 5
(3)
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pp. 317-328
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1997 ◽
Vol 37
(4)
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pp. 691
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1996 ◽
Vol 40
(1)
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pp. 77-89
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