On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture

Author(s):  
F. Poehl ◽  
J. Rzeha ◽  
M. Beck ◽  
M. Goessel ◽  
R. Arnold ◽  
...  
Keyword(s):  
On Chip ◽  
2020 ◽  
pp. 1-13
Author(s):  
Gokul Chandrasekaran ◽  
P.R. Karthikeyan ◽  
Neelam Sanjeev Kumar ◽  
Vanchinathan Kumarasamy

Test scheduling of System-on-Chip (SoC) is a major problem solved by various optimization techniques to minimize the cost and testing time. In this paper, we propose the application of Dragonfly and Ant Lion Optimization algorithms to minimize the test cost and test time of SoC. The swarm behavior of dragonfly and hunting behavior of Ant Lion optimization methods are used to optimize the scheduling time in the benchmark circuits. The proposed algorithms are tested on p22810 and d695 ITC’02 SoC benchmark circuits. The results of the proposed algorithms are compared with other algorithms like Ant Colony Optimization, Modified Ant Colony Optimization, Artificial Bee Colony, Modified Artificial Bee Colony, Firefly, Modified Firefly, and BAT algorithms to highlight the benefits of test time minimization. It is observed that the test time obtained for Dragonfly and Ant Lion optimization algorithms is 0.013188 Sec for D695, 0.013515 Sec for P22810, and 0.013432 Sec for D695, 0.013711 Sec for P22810 respectively with TAM Width of 64, which is less as compared to the other well-known optimization algorithms.


2021 ◽  
Vol 64 (6) ◽  
pp. 107-116
Author(s):  
Yakun Sophia Shao ◽  
Jason Cemons ◽  
Rangharajan Venkatesan ◽  
Brian Zimmer ◽  
Matthew Fojtik ◽  
...  

Package-level integration using multi-chip-modules (MCMs) is a promising approach for building large-scale systems. Compared to a large monolithic die, an MCM combines many smaller chiplets into a larger system, substantially reducing fabrication and design costs. Current MCMs typically only contain a handful of coarse-grained large chiplets due to the high area, performance, and energy overheads associated with inter-chiplet communication. This work investigates and quantifies the costs and benefits of using MCMs with finegrained chiplets for deep learning inference, an application domain with large compute and on-chip storage requirements. To evaluate the approach, we architected, implemented, fabricated, and tested Simba, a 36-chiplet prototype MCM system for deep-learning inference. Each chiplet achieves 4 TOPS peak performance, and the 36-chiplet MCM package achieves up to 128 TOPS and up to 6.1 TOPS/W. The MCM is configurable to support a flexible mapping of DNN layers to the distributed compute and storage units. To mitigate inter-chiplet communication overheads, we introduce three tiling optimizations that improve data locality. These optimizations achieve up to 16% speedup compared to the baseline layer mapping. Our evaluation shows that Simba can process 1988 images/s running ResNet-50 with a batch size of one, delivering an inference latency of 0.50 ms.


2019 ◽  
Vol 5 (11) ◽  
pp. eaaw2687 ◽  
Author(s):  
Nikolaos Farmakidis ◽  
Nathan Youngblood ◽  
Xuan Li ◽  
James Tan ◽  
Jacob L. Swett ◽  
...  

Modern-day computers rely on electrical signaling for the processing and storage of data, which is bandwidth-limited and power hungry. This fact has long been realized in the communications field, where optical signaling is the norm. However, exploiting optical signaling in computing will require new on-chip devices that work seamlessly in both electrical and optical domains, without the need for repeated electrical-to-optical conversion. Phase-change devices can, in principle, provide such dual electrical-optical operation, but assimilating both functionalities into a single device has so far proved elusive owing to conflicting requirements of size-limited electrical switching and diffraction-limited optical response. Here, we combine plasmonics, photonics, and electronics to deliver an integrated phase-change memory cell that can be electrically or optically switched between binary or multilevel states. Crucially, this device can also be simultaneously read out both optically and electrically, offering a new strategy for merging computing and communications technologies.


1965 ◽  
Vol 42 (1) ◽  
pp. 7-14 ◽  
Author(s):  
C. O. Davis ◽  
Ora Smith

2011 ◽  
Vol 62 (2) ◽  
pp. 80-86
Author(s):  
Franc Novak ◽  
Peter Mrak ◽  
Anton Biasizzo

Measuring Static Parameters of Embedded ADC CoreThe paper presents the results of a feasibility study of measuring static parameters of ADC cores embedded in a System-on-Chip. Histogram based technique is employed because it is suitable for built-in self-test. While the theoretical background of the technique has been covered by numerous papers, less attention has been given to implementations in practice. Our goal was the implementation of histogram test in a IEEE Std 1500 wrapper. Two different solutions pursuing either minimal test time or minimal hardware overhead are described. The impact of MOS switches at ADC input on the performed measurements was considered.


2019 ◽  
Vol 32 (9) ◽  
pp. 5303-5312 ◽  
Author(s):  
Gokul Chandrasekaran ◽  
Sakthivel Periyasamy ◽  
Karthikeyan Panjappagounder Rajamanickam

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