Comparison of Joint Strength and Fracture Energy of Lead-free Solder Balls in High Speed Ball Shear/Pull Tests and their Correlation with Board Level Drop Test

2007 ◽  
Author(s):  
Fubin Song ◽  
S. W. Ricky Lee ◽  
Keith Newman ◽  
Stephen Clark ◽  
Bob Sykes
Keyword(s):  
Fracture Energy ◽  
High Speed ◽  
Joint Strength ◽  
Lead Free ◽  
Lead Free Solder ◽  
Ball Shear ◽  
Solder Balls ◽  
Free Solder ◽  
Pull Tests ◽  
Board Level

Effect of Electrode Material on Joint Strength of Soldered Joints With Sn-Bi and Sn-Bi-Sb Lead-Free Solder Balls

2013 ◽  
Author(s):  
Akihiro Hirata ◽  
Ikuo Shohji ◽  
Tetsuyuki Tsuchida ◽  
Toshikazu Ookubo
Keyword(s):  
Shear Force ◽  
Lead Free ◽  
Joint Interface ◽  
Intermetallic Compound Layer ◽  
Lead Free Solder ◽  
Ball Shear ◽  
Joint Properties ◽  
Solder Balls ◽  
Plating Solution ◽  
Free Solder

The aim of this study is to investigate the joint properties of Sn-58mass%Bi and Sn-57mass%Bi-0.5mass%Sb low-melting lead-free solder balls on the electroless Ni/Au and Ni/Pd/Au plated Cu electrodes fabricated with a lead-free plating solution. Compared with the conventional Ni plating solution containing lead, the soldered joints with Ni/Au and Ni/Pd/Au electrodes fabricated with the lead-free plating solution showed comparable joint properties. In the joints with Ni/Pd/Au electrodes, ball shear force increased when the Pd layer is dissolved into solder by multi reflows. In both joints with Ni/Au and Ni/Pd/Au electrodes, a part of the Ni layer was dissolved into solder and thus the (Ni,Cu)3Sn4 intermetallic compound layer formed at the joint interface. Ball shear force decreased upon aging due to the growth of the (Ni,Cu)3Sn4 layer at the joint interface.

Board Level Drop Tests Comparing Lead-Free and Eutectic Solder Interconnects on a BGA Package for Mobile ICT Applications

2004 ◽  
Author(s):  
Greg M. Heaslip ◽  
Jeff M. Punch ◽  
Bryan A. Rodgers ◽  
Claire Ryan
Keyword(s):  
High Speed ◽  
Printed Circuit Boards ◽  
Liquid Crystal Display ◽  
Failure Mechanisms ◽  
Lead Free ◽  
Lead Free Solder ◽  
Drop Tests ◽  
Free Solder ◽  
Board Level ◽  
The Impact

There is considerable reported evidence that a large percentage of failures which afflict portable electronic products are due to impact or shock during use. Failures of the external housing, internal electronic components, package-to-board interconnects, and liquid crystal display panels may occur as the result of accidental drops. Moreover, the introduction of lead-free solder to the electronics industry will bring additional design implications for future generations of mobile information and communication technology (ICT) applications. In this paper, drop tests performed on printed circuit boards (PCBs) populated with ball grid arrays (BGAs) are reported. During testing, measurements from strain gages were recorded using a high-speed data acquisition system. Electrical continuity through each package was monitored during the impact event in order to detect failure of package-to-board interconnects. Life distributions were established for both lead-free and eutectic solders for various drop heights. Microsections of the failed interconnects were obtained to determine the failure mechanisms for a range of drop heights. The life test data presented in this paper suggests that for board level drop testing different failure mechanisms can occur at different stress levels and that there is a considerable difference between lead-free solder characteristic life and tin-lead (SAC) solder characteristic life.

Effect of Thickness of Pd Plating Layer on Shear Strength of Lead-Free Solder Ball Joint With Electroless Ni/Pd/Au Plated Electrode

2011 ◽  
Author(s):  
Takahiro Kano ◽  
Ikuo Shohji ◽  
Tetsuyuki Tsuchida ◽  
Toshikazu Ookubo
Keyword(s):  
Reaction Layer ◽  
Shear Force ◽  
Solder Ball ◽  
Lead Free ◽  
Joint Interface ◽  
Lead Free Solder ◽  
Solder Balls ◽  
Free Solder ◽  
Ball Joints ◽  
Electroless Ni

An electroless Ni/Pd/Au plated electrode is expected to be used as an electrode material for lead-free solder to improve joint reliability. The aim of this study is to investigate the effect of the thickness of the Pd layer on joint properties of the lead-free solder joint with the electroless Ni/Pd/Au plated electrode. Solder ball joints were fabricated with Sn-3Ag-0.5Cu (mass%) lead-free solder balls and electroless Ni/Pd/Au and Ni/Au plated electrodes. Ball shear force and microstructure of the joint were investigated. The (Cu,Ni)6Sn5 reaction layer formed in the joint interface in all specimens. The thickness of the reaction layer decreased with increasing the thickness of the Pd layer. In the joint with a Pd layer 0.36 μm thick, the remained Pd layer was observed in the joint interface. In the joint, impact shear force decreased compared with that of the joint without the remained Pd layer. On the contrary, when the thickness of the Pd layer was less than 0.36 μm, the Pd layer was not remained in the joint interface and impact shear force improved. Impact shear force of the joint with the electroless Ni/Pd/Au plated electrode was higher than that with the electroless Ni/Au one.

scholarly journals Growth Kinetics of Reaction Layers in Flip Chip Joints with Cu-cored Lead-free Solder Balls

2004 ◽  
Vol 45 (3) ◽  
pp. 754-758 ◽  
Author(s):  
Ikuo Shohji ◽  
Yuji Shiratori ◽  
Hiroshi Yoshida ◽  
Masahiko Mizukami ◽  
Akira Ichida
Keyword(s):  
Growth Kinetics ◽  
Flip Chip ◽  
Lead Free ◽  
Lead Free Solder ◽  
Solder Balls ◽  
Free Solder ◽  
Kinetics Of Reaction ◽  
Kinetics Of
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