Temporal Characterization of Embedded Systems Using Nexus

2006 ◽  
Author(s):  
Juan Pardo ◽  
Jose-carlos Campelo ◽  
Juan-carlos Ruiz ◽  
Pedro Gil
Keyword(s):  
Embedded Systems

scholarly journals Experiences on the characterization of parallel applications in embedded systems with Extrae/Paraver

2020 ◽  
Author(s):  
Adrian Munera ◽  
Sara Royuela ◽  
Germán Llort ◽  
Estanislao Mercadal ◽  
Franck Wartel ◽  
...  
Keyword(s):  
Embedded Systems ◽  
Parallel Applications

Measuring and Characterization of Telecontrol Time in Embedded Systems

2017 ◽  
Author(s):  
Jorge S. Valdez-Martinez ◽  
Jonathan Villanueva-Tavira ◽  
Jesse Y. Rumbo-Morales ◽  
Alberto M. Beltran-Escobar ◽  
Ivan Alcala-Barojas ◽  
...  
Keyword(s):  
Embedded Systems

scholarly journals Accurate energy characterization of OS services in embedded systems

2012 ◽  
Vol 2012 (1) ◽  
Author(s):  
Bassem Ouni ◽  
Cécile Belleudy ◽  
Eric Senn
Keyword(s):  
Embedded Systems

scholarly journals Impact of Laser Attacks on the Switching Behavior of RRAM Devices

Electronics ◽  
2020 ◽  
Vol 9 (1) ◽  
pp. 200
Author(s):  
Daniel Arumí ◽  
Salvador Manich ◽  
Álvaro Gómez-Pau ◽  
Rosa Rodríguez-Montañés ◽  
Víctor Montilla ◽  
...  
Keyword(s):  
Embedded Systems ◽  
Random Access ◽  
Switching Behavior ◽  
Electronic Format ◽  
Secret Data ◽  
Promising Alternative ◽  
Private Data ◽  
Secure Embedded Systems ◽  
Iot Devices

The ubiquitous use of critical and private data in electronic format requires reliable and secure embedded systems for IoT devices. In this context, RRAMs (Resistive Random Access Memories) arises as a promising alternative to replace current memory technologies. However, their suitability for this kind of application, where the integrity of the data is crucial, is still under study. Among the different typology of attacks to recover information of secret data, laser attack is one of the most common due to its simplicity. Some preliminary works have already addressed the influence of laser tests on RRAM devices. Nevertheless, the results are not conclusive since different responses have been reported depending on the circuit under testing and the features of the test. In this paper, we have conducted laser tests on individual RRAM devices. For the set of experiments conducted, the devices did not show faulty behaviors. These results contribute to the characterization of RRAMs and, together with the rest of related works, are expected to pave the way for the development of suitable countermeasures against external attacks.

Morphological Characterization of Mycobacteriophage R1

1974 ◽  
Vol 32 ◽  
pp. 254-255
Author(s):  
B. L. Soloff ◽  
T. A. Rado
Keyword(s):  
Carbon Source ◽  
Stationary Phase ◽  
Growth Phase ◽  
Minimal Medium ◽  
Morphological Characterization ◽  
Logarithmic Growth Phase ◽  
Complete Lysis ◽  
Lysogenic Culture ◽  
Logarithmic Growth

Mycobacteriophage R1 was originally isolated from a lysogenic culture of M. butyricum. The virus was propagated on a leucine-requiring derivative of M. smegmatis, 607 leu−, isolated by nitrosoguanidine mutagenesis of typestrain ATCC 607. Growth was accomplished in a minimal medium containing glycerol and glucose as carbon source and enriched by the addition of 80 μg/ ml L-leucine. Bacteria in early logarithmic growth phase were infected with virus at a multiplicity of 5, and incubated with aeration for 8 hours. The partially lysed suspension was diluted 1:10 in growth medium and incubated for a further 8 hours. This permitted stationary phase cells to re-enter logarithmic growth and resulted in complete lysis of the culture.

AEM analysis of crystallization in Ti-based amorphous alloys

1983 ◽  
Vol 41 ◽  
pp. 270-271
Author(s):  
A.R. Pelton ◽  
A.F. Marshall ◽  
Y.S. Lee
Keyword(s):  
Magnetic Properties ◽  
Amorphous Alloys ◽  
Amorphous Materials ◽  
Isothermal Annealing ◽  
Amorphous Matrix ◽  
Nucleation And Growth ◽  
Current Interest ◽  
Amorphous Films ◽  
Electrical And Magnetic Properties

Amorphous materials are of current interest due to their desirable mechanical, electrical and magnetic properties. Furthermore, crystallizing amorphous alloys provides an avenue for discerning sequential and competitive phases thus allowing access to otherwise inaccessible crystalline structures. Previous studies have shown the benefits of using AEM to determine crystal structures and compositions of partially crystallized alloys. The present paper will discuss the AEM characterization of crystallized Cu-Ti and Ni-Ti amorphous films.Cu60Ti40: The amorphous alloy Cu60Ti40, when continuously heated, forms a simple intermediate, macrocrystalline phase which then transforms to the ordered, equilibrium Cu3Ti2 phase. However, contrary to what one would expect from kinetic considerations, isothermal annealing below the isochronal crystallization temperature results in direct nucleation and growth of Cu3Ti2 from the amorphous matrix.

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