Isothermal Fatigue Tests Of Plastic Ball Grid Array (PBGA) SnAgCu Lead-Free Solder Joints At 60oC

Author(s):  
J. Lau ◽  
S.W.R. Lee ◽  
Fubin Song ◽  
D. Lau ◽  
Dongkai Shangguan
Author(s):  
John Lau ◽  
Ricky Lee ◽  
Walter Dauksher ◽  
Dongkai Shangguan ◽  
Fubin Song ◽  
...  

Reliability of plastic ball grid array (PBGA) SnAgCu lead-free solder joints is investigated. Emphasis is placed on the design for reliability (DFR) of lead-free solder joints. In particular, the thermal-fatigue life of the lead-free solder joints of a PBGA package assembly is predicted and compared with thermal cycling test results.


Author(s):  
John Lau ◽  
S. W. Ricky Lee ◽  
Fubin Song ◽  
Dongkai Shangguan ◽  
Dennis C. Lau ◽  
...  

A new thermal-fatigue life prediction equation for a class of lead-free solder alloys, 95.5wt%Sn4.0wt%Ag0.5wt%Cu, is proposed in this investigation. The test vehicle consists of a lead-free solder plastic ball grid array (PBGA) package, a lead-free PCB, and lead-free solder paste (95.5wt%Sn3.9wt%Ag0.6wt%Cu). The coefficients of the fatigue equation presented herein are determined by best fit of the test vehicle’s isothermal fatigue data. Failure modes and locations of the failed samples are discussed.


Author(s):  
John Lau ◽  
Ricky Lee ◽  
Dongkai Shangguan

Reliability of lead-free solder joints is investigated. Emphasis is placed on the design for reliability (DFR) of lead-free solder joints. In particular, the thermal-fatigue life of the lead-free solder joints of a plastic ball grid array (PBGA) package assembly is predicted and discussed.


2009 ◽  
Vol 38 (12) ◽  
pp. 2702-2711 ◽  
Author(s):  
Bite Zhou ◽  
Thomas R. Bieler ◽  
Tae-Kyu Lee ◽  
Kuo-Chuan Liu

2008 ◽  
Vol 48 (3) ◽  
pp. 431-437 ◽  
Author(s):  
Qiang Yu ◽  
Tadahiro Shibutani ◽  
Do-Seop Kim ◽  
Yusuke Kobayashi ◽  
Jidong Yang ◽  
...  

Author(s):  
John Lau ◽  
Walter Dauksher

The effects of temperature-cycling dwell-time on the thermal-fatigue life of lead-free solder joints are investigated in this study. Emphasis is placed on the determination of creep responses and the creep strain energy density per cycle of a PBGA (plastic ball grid array) package’s lead-free solder joints subjected to various dwell times (namely, 15, 60, and 480 minutes) at peak cycling temperatures (0°C and 100°C).


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