On-wafer inductors for SOS-based RF ICs

2004 Proceedings. 54th Electronic Components and Technology Conference (IEEE Cat. No.04CH37546) ◽

10.1109/ectc.2004.1319480 ◽

2004 ◽

Author(s):

P. Karjalainen ◽

E.O. Ristolainen

Keyword(s):

Rf Ics

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Chip Level Simulation of Substrate Noise Coupling and Interference in RF ICs with CMOS Digital Noise Emulator

IEICE Transactions on Electronics ◽

10.1587/transele.e97.c.546 ◽

2014 ◽

Vol E97.C (6) ◽

pp. 546-556

Author(s):

Naoya AZUMA ◽

Shunsuke SHIMAZAKI ◽

Noriyuki MIURA ◽

Makoto NAGATA ◽

Tomomitsu KITAMURA ◽

...

Keyword(s):

Substrate Noise ◽

Noise Coupling ◽

Substrate Noise Coupling ◽

Rf Ics

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Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation

2021 IEEE 39th VLSI Test Symposium (VTS) ◽

10.1109/vts50974.2021.9441034 ◽

2021 ◽

Author(s):

V. A. Niranjan ◽

D. Neethirajan ◽

C. Xanthopoulos ◽

E. De La Rosa ◽

C. Alleyne ◽

...

Keyword(s):

Time Reduction ◽

Rf Ics

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Wideband RF ICs for power detection and control

Analog Circuit Design ◽

10.1016/b978-0-12-800001-4.00502-0 ◽

2015 ◽

pp. 1081-1082

Author(s):

James Wong ◽

Vladimir Dvorkin

Keyword(s):

And Control ◽

Rf Ics

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From on-chip self-healing to self-adaptivity in analog/RF ICs: challenges and opportunities

2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) ◽

10.1109/iolts.2018.8474078 ◽

2018 ◽

Cited By ~ 2

Author(s):

Martin Andraud ◽

Marian Verhelst

Keyword(s):

Self Healing ◽

Challenges And Opportunities ◽

On Chip ◽

Rf Ics

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Analysis and optimization of accumulation-mode varactor for RF ICs

1998 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.98CH36215) ◽

10.1109/vlsic.1998.687993 ◽

2002 ◽

Cited By ~ 80

Author(s):

T. Soorapanth ◽

C.P. Yue ◽

D.K. Shaeffer ◽

T.I. Lee ◽

S.S. Wong

Keyword(s):

Accumulation Mode ◽

Rf Ics

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Low-power RF-ICs in wireless transceivers

Proceedings of 1994 IEEE Symposium on Low Power Electronics ◽

10.1109/lpe.1994.573188 ◽

2002 ◽

Cited By ~ 2

Author(s):

A.A. Abidi

Keyword(s):

Low Power ◽

Wireless Transceivers ◽

Rf Ics

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Cost-competitive RF wafer test methodology for high volume production of complex RF ICs

2008 58th Electronic Components and Technology Conference ◽

10.1109/ectc.2008.4550136 ◽

2008 ◽

Cited By ~ 3

Author(s):

Andrea Paganini ◽

Mustapha Slamani ◽

Hanyi Ding ◽

John Ferrario ◽

Nanju Na

Keyword(s):

High Volume ◽

Test Methodology ◽

High Volume Production ◽

Volume Production ◽

Wafer Test ◽

Rf Ics

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Deep trench guard technology to suppress coupling between inductors in silicon RF ICs

2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No.01CH37157) ◽

10.1109/mwsym.2001.967273 ◽

2002 ◽

Author(s):

Cheon Soo Kim ◽

Piljae Park ◽

Joung-Woo Park ◽

Nam Hwang ◽

Hyu Kyu Yu

Keyword(s):

Deep Trench ◽

Rf Ics

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New techniques for non-linear behavioral modeling of microwave/RF ICs from simulation and nonlinear microwave measurements

Proceedings of the 40th conference on Design automation - DAC '03 ◽

10.1145/775832.775856 ◽

2003 ◽

Cited By ~ 1

Author(s):

David E. Root ◽

John Wood ◽

Nick Tufillaro

Keyword(s):

Behavioral Modeling ◽

Microwave Measurements ◽

New Techniques ◽

Non Linear ◽

Rf Ics

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CMOS-Compatible Suspended Square Inductors on Silicon Wafers for RF ICs

10.7567/ssdm.2006.a-3-2 ◽

2006 ◽

Author(s):

Chih-Ming Tai ◽

Chien-Neng Liao

Keyword(s):

Silicon Wafers ◽

Cmos Compatible ◽

Rf Ics

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