Integrated balun design for SiGe system-on-a-chip

2016 ◽  
Author(s):  
A. S. Salnikov ◽  
A. A. Kokolov ◽  
F. I. Scheyerman ◽  
R. Yu. Musenov ◽  
I. M. Dobush ◽  
...  
Keyword(s):  
System On A Chip

Localization of a Complex Failure by Combining ATPG and Customer-Oriented Application Testing

2013 ◽  
Author(s):  
Kai Wang ◽  
Rhys Weaver ◽  
David Johnson
Keyword(s):  
Failure Analysis ◽  
Semiconductor Device ◽  
Digital Design ◽  
Radio Communication ◽  
Communication Failure ◽  
Systemic Analysis ◽  
Rf Communication ◽  
System On A Chip ◽  
Electrical Diagnostics ◽  
Failure Location

Abstract A systemic analysis was chosen to evaluate a real case Bluetooth (BT) radio failure in the aspects of RF communication, digital design, firmware, application software, semiconductor device physics and processing, and failure analysis. This paper explores the range of testing, including customer application testing, required to confirm and localize a BT RF communication failure. It shows that the radio communication failure was not, as expected, caused by faulty radio hardware; it was rather linked to problematic encryption hardware at the assistance of the Synergy BT to mobile application. The paper also explores that the digital fault can only be detected by the timing sensitive transition fault scan patterns and how to obtain the physical failure location. Thus, the combination of ATPG and application testing provides a consistency between electrical diagnostics which yields a higher success rate at subsequent physical failure analysis of complex modern RF System on a Chip.

Test data compression of system-on-a-chip (SoC) based on partial runs reversing

2010 ◽  
Vol 24 (1) ◽  
pp. 23-28
Author(s):  
Yiming Ouyang ◽  
Baosheng Zou ◽  
Huaguo Liang ◽  
Xi’e Huang
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
System On A Chip

Object-based hardware/software component interconnection model for interface design in system-on-a-chip circuits

2004 ◽  
Vol 70 (3) ◽  
pp. 229-244 ◽  
Author(s):  
W. Cesário ◽  
L. Gauthier ◽  
D. Lyonnard ◽  
G. Nicolescu ◽  
A.A. Jerraya
Keyword(s):  
Interface Design ◽  
Software Component ◽  
Object Based ◽  
System On A Chip

Formal verification of an industrial system-on-a-chip

2002 ◽  
Author(s):  
Hoon Choi ◽  
Myung-Kyoon Yim ◽  
Jae-Young Lee ◽  
Byeong-Whee Yun ◽  
Yun-Tae Lee
Keyword(s):  
Formal Verification ◽  
Industrial System ◽  
System On A Chip

scholarly journals A Mathematical Method for Determining the Parameters of Functional Dependencies Using Multiscale Probability Distribution Functions

Mathematics ◽  
2021 ◽  
Vol 9 (10) ◽  
pp. 1085
Author(s):  
Ilya E. Tarasov
Keyword(s):  
Experimental Data ◽  
Probability Distribution ◽  
Integrated Circuits ◽  
Distribution Functions ◽  
Independent Parameter ◽  
Functional Dependencies ◽  
Computing Device ◽  
System On A Chip ◽  
Error Probability Distribution ◽  
Special Case

This article discusses the application of the method of approximation of experimental data by functional dependencies, which uses a probabilistic assessment of the deviation of the assumed dependence from experimental data. The application of this method involves the introduction of an independent parameter “scale of the error probability distribution function” and allows one to synthesize the deviation functions, forming spaces with a nonlinear metric, based on the existing assumptions about the sources of errors and noise. The existing method of regression analysis can be obtained from the considered method as a special case. The article examines examples of analysis of experimental data and shows the high resistance of the method to the appearance of single outliers in the sample under study. Since the introduction of an independent parameter increases the number of computations, for the practical application of the method in measuring and information systems, the architecture of a specialized computing device of the “system on a chip” class and practical approaches to its implementation based on programmable logic integrated circuits are considered.

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