Reliable response of RF MEMS LTCC packaged switches after mechanical and thermal stress

Author(s):  
A. Lucibello ◽  
G. Capoccia ◽  
E. Proietti ◽  
R. Marcelli ◽  
B. Margesin ◽  
...  
Keyword(s):  
2015 ◽  
Vol 22 (3) ◽  
pp. 495-501 ◽  
Author(s):  
A. Lucibello ◽  
G. Capoccia ◽  
E. Proietti ◽  
R. Marcelli ◽  
B. Margesin ◽  
...  
Keyword(s):  

2010 ◽  
Vol 130 (6) ◽  
pp. 247-252
Author(s):  
Michihiko Nishigaki ◽  
Toshihiko Nagano ◽  
Hiroshi Ono ◽  
Takashi Kawakubo ◽  
Kazuhiko Itaya
Keyword(s):  
Rf Mems ◽  

PIERS Online ◽  
2008 ◽  
Vol 4 (4) ◽  
pp. 433-436 ◽  
Author(s):  
Yaping Liang ◽  
Calvin W. Domier ◽  
Neville C. Luhmann, Jr.

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