Design, Test, Integration and Packaging of MEMS/MOEMS 2003 (IEEE Cat. No.03EX713)

Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS 2003. ◽

10.1109/dtip.2003.1286995 ◽

2003 ◽

Keyword(s):

Test Integration

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Software Reliability, Measurement, and Testing Software Reliability and Test Integration

10.21236/ada256242 ◽

1992 ◽

Cited By ~ 4

Author(s):

James A. McCall ◽

William Randell ◽

Janet Dunham ◽

Linda Lauterbach

Keyword(s):

Software Reliability ◽

Measurement And Testing ◽

Test Integration ◽

Reliability Measurement

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Fast Test Integration: Toward Plug-and-Play At-Speed Testing of Multiple Clock Domains Based on IEEE Standard 1500

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2010.2055010 ◽

2010 ◽

Vol 29 (11) ◽

pp. 1837-1842

Author(s):

Po-Lin Chen ◽

Yu-Chieh Huang ◽

Tsin-Yuan Chang

Keyword(s):

Plug And Play ◽

Ieee Standard ◽

Test Integration ◽

Clock Domains

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Design, test, integration and packaging of MEMS/MOEMS, 2005

Microsystem Technologies ◽

10.1007/s00542-006-0114-2 ◽

2006 ◽

Vol 12 (10-11) ◽

pp. 891-891

Author(s):

Bernard Courtois ◽

Bernd Michel

Keyword(s):

Test Integration

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Professionalität: Test, Integration, Release

Scrum ◽

10.3139/9783446448360.006 ◽

2016 ◽

pp. 219-232

Author(s):

Boris Gloger

Keyword(s):

Test Integration

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2016 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)

10.1109/dtip38890.2016 ◽

2016 ◽

Keyword(s):

Test Integration

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2008 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS

10.1109/mems/moems14016.2008 ◽

2008 ◽

Keyword(s):

Test Integration

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Microsystem technologies: foreword to special issue on design, test, integration and packaging of MEMS/MOEMS, 2009

Microsystem Technologies ◽

10.1007/s00542-010-1082-0 ◽

2010 ◽

Vol 16 (7) ◽

pp. 1035-1035

Author(s):

Bernard Courtois ◽

Bernd Michel

Keyword(s):

Special Issue ◽

Test Integration ◽

Microsystem Technologies

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EDACs and test integration strategies for NAND flash memories

2010 East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2010.5742060 ◽

2010 ◽

Cited By ~ 2

Author(s):

Stefano Di Carlo ◽

Michele Fabiano ◽

Roberto Piazza ◽

Paolo Prinetto

Keyword(s):

Nand Flash ◽

Flash Memories ◽

Test Integration ◽

Integration Strategies

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Development of a Real-Time Capable Integrated Aircraft Model for Test, Integration, and Development Support

2013 Aviation Technology, Integration, and Operations Conference ◽

10.2514/6.2013-4271 ◽

2013 ◽

Author(s):

Clare Savaglio

Keyword(s):

Real Time ◽

Aircraft Model ◽

Development Support ◽

Test Integration

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Foreword to special issue on Design, Test, Integration and Packaging of MEMS/MOEMS, 2008

Microsystem Technologies ◽

10.1007/s00542-009-0887-1 ◽

2009 ◽

Vol 15 (8) ◽

pp. 1119-1119

Author(s):

Bernard Courtois ◽

Bernd Michel

Keyword(s):

Special Issue ◽

Test Integration

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