Generation and verification of tests for analogue circuits subject to process parameter deviations
High Temperature Material Processes An International Quarterly of High-Technology Plasma Processes
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2016 ◽
Vol 20
(3)
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pp. 197-224
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2010 ◽
Vol 3
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pp. 25-33
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2020 ◽
Vol 988
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pp. 012056
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2021 ◽
Vol 1034
(1)
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pp. 012177
2021 ◽
Vol 1913
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pp. 012122
2014 ◽
Vol 494-495
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pp. 461-465
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